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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 433 records · Page 24

All sources NASA NTRS DOE OSTI

NASA NTRS1994

Program test objectives milestone 3

The following conclusions have been developed relative to propulsion system technology adequacy for efficient development and operation of recoverable and expendable launch vehicles (RLV and ELV) and the benefits which the integrated propulsion technology demonstrator will provide for enhancing technology: (1) Technology improvements relative to propulsion system design and operation can reduce program cost. Many features or improvement needs to enhance operability, reduce cost, and improve payload are identified. (2) The Integrated Propulsion Technology Demonstrator (IPTD) Program provides a means of resolving the majority of issues associated with improvement needs. (3) The IPTD will evaluate complex integration of vehicle and facility functions in fluid management and propulsion control systems, and provides an environment for validating improved mechanical and electrical components. (4) The IPTD provides a mechanism for investigating operational issues focusing on reducing manpower and time to perform various functions at the launch site. These efforts include model development, collection of data to validate subject models, and ultimate development of complex time line models. (5) The IPTD provides an engine test bed for tri/bi-propellant engine development firings which is representative of the actual vehicle environment. (6) The IPTD provides for only a limited multiengine configuration integration environment for RLV. Multiengine efforts may be simulated for a number of subsystems and a number of subsystems are relatively independent of the multiengine influences.

Gaynor, T. L.↗

NASA NTRS1979

Transistor step stress testing program for JANTX2N2905A

The effect of power/temperature step stress when applied to the transistor JANTX2N2905A manufactured by Texas Instruments and Motorola is reported. A total of 48 samples from each manufacturer was submitted to the process outlined. In addition, two control sample units were maintained for verification of the electrical parametric testing. All test samples were subjected to the electrical tests outlined in Table 2 after completing the prior power/temperature step stress point.

Source record↗

NASA NTRS1979

Transistor step stress testing program for JANTX2N4856

The effect of power/temperature step stress when applied to a field effect transistor JANTX2N4856 manufactured by Texas Instruments and Teledyne was evaluated. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control units were maintained for verification of the electrical parametric testing.

Source record↗

NASA NTRS1979

Diode step stress testing program for JANTX1N2989B

The effect of power/temperature step stress when applied to the zener diode JANTX2N2989 manufactured by Siemens and General Semiconductor is reported. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control sample units were maintained for verification of the electrical parameteric testing.

Source record↗

NASA NTRS1979

Diode step stress testing program for JANTX1N5618

The effect of power/temperature step stress when applied to the switching diode JANTX1N5618 manufactured by Semtech and Micro Semiconductor is reported. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control sample units were maintained for verification of the electrical parametric testing.

Source record↗

NASA NTRS1947

Data Obtained in the Flight Measurements to Determine the Stability and Control Characteristics of a C-54D Airplane (AAF No. 42-72713) and a Summary of the Test Program

The flight investigation of the C-54D airplane was initiated to determine the necessity of changes or additions to existing handling-qualities requirements to cove the case of instrument approaches with large airplanes. This paper gives a brief synopsis of the results and presents the measured data of tests to determine the stability and control characteristics. It was found that no new requirements were necessary to cover the problems of instrument approaches. The C-54D airplane tested met the Amy and Navy stability and control requirements except for the following items. The control-system friction with autopilot installed vas double that allowed by the requirements. The amount of friction was found to impair the controllability of the airplane in precision flying. The lateral and directional characteristics were good except that the maximum pb/2V was slightly below the minimum required, and the elevator-control forces to obtain the maximum pb/2V at low speeds were above the Army and Navy requirements. The longitudinal stability and control characteristics were good except that the elevator-control forces exceeded the limits of the Army and Navy requirements in turns and in landings. The stalling characteristics were considered good in all conditions with the stall warning in the form of tail buffeting occurring at speeds approximately 5 miles per hour above the stall.

Talmage, Donald B.↗

NASA NTRS1979

Diode step stress testing program for JANTX1N3016B

The effect of power/temperature step stress when applied to a variety the zener diode JANTX2N3016B manufactured by Siemens and Motorola is reported. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control sample units were maintained for verification of the electrical parametric testing.

Source record↗

NASA NTRS1979

Transister step stress testing program for JANTX2N3811

The effect was studied of power/temperature step stress when applied to the dual transistor JANTX2N3811 manufactured by Motorola and National Semiconductor. A total of 48 samples from Motorola and 47 from National Semiconductor was submitted to the processes. In addition, two control sample units were maintained for verification of the electrical parametric testing. The tests for determining power/temperature stresses are described, and test results are discussed. Failure analyses for power stress, and temperature stress are presented.

Source record↗

NASA NTRS1979

Transistor step stress testing program for JANTX2N2484

The effect of power/temperature step stress when applied to the transistor JANTX2N2484, manufactured by Raytheon and Teledyne was evaluated. Forty-eight samples from each manufacturer were divided equally (16 per group) into three groups and submitted to the processes outlined. In addition, two control sample units were maintained for verification of the electrical parametric testing.

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NASA NTRS1988

Mast material test program (MAMATEP)

The MAMATEP program, which is aimed at verifying the need for and evaluating the performance of various protection techniques for the solar array assembly mast of the Space Station photovoltaic power module, is discussed. Coated and uncoated mast material samples have been environmentally tested and evaluated, before and after testing, in terms of mass and bending modulus. The protective coatings include CV-1144 silicone, a Ni/Al/InSn eutectic, and an open-weave Al braid. Long-term plasma asher results from unprotected samples indicate that, even though fiberglass-epoxy samples degrade, a protection technique may not be necessary to ensure structural integrity. A protection technique, however, may be desirable to limit or contain the amount of debris generated by the degradation of the fiberglass-epoxy.

Ciancone, Michael L.↗

NASA NTRS1979

Diode step stress testing program for JANTX1n5420

Data compiled for the purpose of evaluating the effect of power/temperature step stress when applied to the diode JANTX1N5420 manufactured by Unitrode and Micro-Semiconductor is presented. A total of 48 samples from each manufacturer was submitted to the processes outlined. In addition, two control sample units were maintained for verification of the electrical parametric testing.

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NASA NTRS2013

Summary of the 2012 Inductive Pulsed Plasma Thruster Development and Testing Program

Inductive pulsed plasma thrusters are spacecraft propulsion devices in which energy is capacitively stored and then discharged through an inductive coil. While these devices have shown promise for operation at high efficiency on a range of propellants, many technical issues remain before they can be used in flight applications. A conical theta-pinch thruster geometry was fabricated and tested to investigate potential improvements in propellant utilization relative to more common, flat-plate planar coil designs. A capacitor charging system is used to permit repetitive discharging of thrusters at multiple cycles per second, with successful testing accomplished at a repetition-rate of 5 Hz at power levels of 0.9, 1.6, and 2.5 kW. The conical theta-pinch thruster geometry was tested at cone angles of 20deg, 38deg, and 60deg, with single-pulse operation at 500 J/pulse and repetitionrate operation with the 38deg model quantified through direct thrust measurement using a hanging pendulum thrust stand. A long-lifetime valve was designed and fabricated, and initial testing was performed to measure the valve response and quantify the leak rate at beginning-of-life. Subscale design and testing of a capacitor charging system required for operation on a spacecraft is reported, providing insights into the types of components needed in the circuit topology employed. On a spacecraft, this system would accept as input a lower voltage from the spacecraft DC bus and boost the output to the high voltage required to charge the capacitors of the thruster.

Polzin, K. A.↗

NASA NTRS1985

Space test program of high-voltage solar array-space plasma interactions

Future spacecraft, notably the proposed Space Station, will require power systems much larger than have previously been flown. It is recognized that at higher voltages, and at the relatively high plasma density present at low Earth orbital altitudes, undesirable interactions between the high voltage solar array and the space plasma will occur. Space experiments on high voltage solar array space plasma interactions in low Earth orbit are an absolute requirement for confident design of a higher voltage solar array. Experiments are presently being identified to provide the necessary space data for calibration of ground testing, validation of analytical models, and development of design guidelines required for confident design of high voltage solar arrays in space. A proposed flight experiment program which is designed to obtain the required data is summarized.

Carruth, M. R., Jr.↗

NASA NTRSDate not supplied

Heritage to Flight: The Test Program that Brought an Inflation System Back to Life for LOFTID

Following the success of the Inflatable Reentry Vehicle Experiment-3 (IRVE-3) project, the Terrestrial Hypersonic Inflatable Aerodynamic Decelerator (HIAD) Orbital Reentry (THOR) project was stood up with a “built to print” Inflation System utilizing the IRVE-3 flight spares. When THOR was canceled, this Inflation System had already been tested and assembled, ready for use. Thus, when the Low Earth Orbit Flight Test of an Inflatable Decelerator (LOFTID) was spun up, the THOR system seemed like a good candidate to salvage flight ready hardware. There were, however, some key differences in the IRVE/THOR system and the LOFTID one. LOFTID’s HIAD was two times the size of IRVE for starters and would require much higher flows to accommodate inflating such an article within a specific timeframe. With new requirements and a tight schedule, the LOFTID Inflation team set to work to verify flight readiness under LOFTID conditions and eliminate the need to requalify new hardware. LOFTID, utilizing an Inflation System built primarily hardware from IRVE-3 spares, successfully flew in November of 2022. This paper will outline the mission differences, the test campaign used to prepare LOFTID’s Inflation System for flight, and some lessons learned in repurposing older hardware.

Inflation System↗

NASA NTRSDate not supplied

Heritage to Flight: The Test Program that Brought an Inflation System Back to Life for LOFTID

Inflation System↗

DOE OSTI2020

An Accelerated Creep Testing Program For Nickel Based Superalloys

In order to improve the energy production within the United States, new materials are developed with the goal of increased functionality. These materials are required to perform at extreme pressures and temperatures (up to and beyond 200MPa and 650â??) as well as be sustainable beyond 105 hours. Before developing these materials into components for power generation, mechanical testing is required to better understand the behavior of these materials at various loads and temperatures. The longest of these tests is the conventional creep test which is a real time test that can beyond 105 hours depending on service conditions. Hundreds of specimens must be tested before being approved for use in power generation, but it is extremely difficult to rapidly qualify when each material is required to exceed 105 hours making testing through conventional means unfeasible. While others have designed accelerated testing methods to help qualify materials, many of these experiments use an empirical approach that requires test data to fit already existing creep data. In this study, an accelerated creep test called the stepped isostress method (SSM) is then applied to wrought Inconel 718 (IN 718) specimens. A test matrix is designed using deformation mechanism maps, time-temperature-transformation diagrams, and time-temperature-precipitation diagrams, in order to ensure that microstructurally, the accelerated creep tests fail similarly to the conventional creep tests. The data from the stepped isostress method is then applied to the McVetty and Sin-hyperbolic (Sinh) constitutive models in order to generate a creep master curve. The results from the model fits are then compared to the conventional creep data done from experiments as well as from the NIMS database for Inconel 718. Optical microscopy and scanning electron microscopy are used to compare the evolution of the microstructure from the conventional creep and accelerated creep tests. It is found that using the Sinh model on the accelerated creep data provides reasonable creep rupture predictions when compared to the scatter band of creep tests. It was also observed that the microstructural evolution between the SSM experiments and creep tests were very similar in terms of the volume fraction of precipitates and phases.

Mach, Robert↗

NASA NTRS1979

Transistor step stress testing program for JANTX2N3637

Data for the purpose of evaluating the effect of power/temperature step stress when applied to a variety of semiconductor devices are presented. The transistor JANTX2N3637 manufactured by Transitron and Motorola is studied. A total of 48 samples from Transitron and 41 samples from Motorola were submitted to the process. In addition, two control sample units were maintained for verification of the electrical parametric testing. Results are reported.

Source record↗

NASA NTRS1983

Orbiter windward surface entry Heating: Post-orbital flight test program update

Correlations of orbiter windward surface entry heating data from the first five flights are presented with emphasis on boundary layer transition and the effects of catalytic recombination. Results show that a single roughness boundary layer transition correlation developed for spherical element trips works well for the orbiter tile system. Also, an engineering approach for predicting heating in nonequilibrium flow conditions shows good agreement with the flight test data in the time period of significant heating. The results of these correlations, when used to predict orbiter heating for a high cross mission, indicate that the thermal protection system on the windward surface will perform successfully in such a mission.

Harthun, M. H.↗