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NASA NTRS · 20205007083

Microsemi PolarFire® Field Programmable Gate Array Single Event Effects Test Report

Melanie Berg·Hak Kim·Michael Campola·Jonathan Pellish
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Field Programmable Gate Array (FPGA)single event effect (SEE)Single Event Transient (SET)Single Event Upset (SEU)single event functional interrupt (SEFI)single event latch-up (SEL)single event failure (SEF)

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Melanie Berg, Hak Kim, Michael Campola, Jonathan Pellish. 2019-12-15. Microsemi PolarFire® Field Programmable Gate Array Single Event Effects Test Report. https://ntrs.nasa.gov/citations/20205007083

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