Recommendations for Use of Commercial-off-the-Shelf Components in Civil Space Missions
Explore the source record for details and available documents.
Engineering topics
Publications and source records attributed to Jonathan Pellish.
Explore the source record for details and available documents.
Explore the source record for details and available documents.
Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FPGAs, optoelectronics, digital, analog, and bipolar devices.
We present the current status of United States domestic heavy ion single-event effects (SEE) radiation test facilities, including general perspectives on near- and mid-term needs for both capacity and capabilities.
Explore the source record for details and available documents.
Explore the source record for details and available documents.
Explore the source record for details and available documents.
Explore the source record for details and available documents.
Explore the source record for details and available documents.
Explore the source record for details and available documents.