An overview of the 2020 single event effects FPGA effort performed by the NASA Electronic Parts and Packaging Group is presented. Information includes Heavy-ion data for the following FPGA devices: Xilinx Kintex-UltraScale and Microsemi PolarFire. Future work is presented.

Single Event Effects (SEE)↗

NASA NTRS2020

Single Event Effects in Field Programmable Gate Array (FPGA) Devices: Update 2020

Single Event Effects (SEE)↗

NASA NTRS2019

Microsemi PolarFire® Field Programmable Gate Array Single Event Effects Test Report

Explore the source record for details and available documents.

Field Programmable Gate Array (FPGA)↗

NASA NTRS2019

Xilinx Kintex-Ultrascale Field Programmable Gate Array Single Event Effects (SEE) Heavy-ion Test Report

This report presents 2019 LBNL SEE data and compares previous Texas A&M data to LBNL SEE DUT responses.

Field Programmable Gate Array (FPGA)↗

NASA NTRSDate not supplied

NASA Goddard Space Flight Center’s Recent Radiation Effects Test Results

Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FPGAs, optoelectronics, digital, analog, and bipolar devices.

Single-Event Effects (SEE)↗

NASA NTRSDate not supplied

Application of Multi-Use Platforms for Test-As-You-Fly Radiation, Reliability, and Security Assurance Testing

Explore the source record for details and available documents.

Melanie Berg↗