The Value of "Test-As-You-Fly": Modernizing Experimentation and Data Analysis for NASA Missions
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Melanie Berg↗
Engineering topics
Hak Kim
Publications and source records attributed to Hak Kim.
NEPP 2021 FPGA Radiation Effects Update: Microchip PolarFire (Single Event Effects) and Lattice Crosslink-NX (Total Ionizing Dose)
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Melanie Berg↗
Single-Event Effect Testing of the Cree CMF10120D SiC Power MOSFET
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Jean- Marie Lauenstein↗
Single Event Effects in Field Programmable Gate Array (FPGA) Devices: Update 2020
An overview of the 2020 single event effects FPGA effort performed by the NASA Electronic Parts and Packaging Group is presented. Information includes Heavy-ion data for the following FPGA devices: Xilinx Kintex-UltraScale and Microsemi PolarFire. Future work is presented.
Single Event Effects (SEE)↗
Update on Wide Bandgap (WBG) Device Radiation Hardness Assurance
This presentation provides an overview of recent wide bandgap device radiation hardness assurance activities at NASA and via NASA-funded grant vehicles. Devices include enhancement mode power GaN HEMTs, RF GaN HEMTs, and SiC MOSFETs and JBS diodes.
wide bandgap↗
Single Event Effects in Field Programmable Gate Array (FPGA) Devices: Update 2020
An overview of the 2020 single event effects FPGA effort performed by the NASA Electronic Parts and Packaging Group is presented. Information includes Heavy-ion data for the following FPGA devices: Xilinx Kintex-UltraScale and Microsemi PolarFire. Future work is presented.
Single Event Effects (SEE)↗
Microsemi PolarFire® Field Programmable Gate Array Single Event Effects Test Report
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Field Programmable Gate Array (FPGA)↗
Xilinx Kintex-Ultrascale Field Programmable Gate Array Single Event Effects (SEE) Heavy-ion Test Report
This report presents 2019 LBNL SEE data and compares previous Texas A&M data to LBNL SEE DUT responses.
Field Programmable Gate Array (FPGA)↗