Engineering PapersSearch

NASA NTRS · 20205003879

Single Event Effects in Field Programmable Gate Array (FPGA) Devices: Update 2020

Abstract

An overview of the 2020 single event effects FPGA effort performed by the NASA Electronic Parts and Packaging Group is presented. Information includes Heavy-ion data for the following FPGA devices: Xilinx Kintex-UltraScale and Microsemi PolarFire. Future work is presented.

Explore related subjects

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Melanie Berg, Michael Campola, Hak Kim, Anthony Phan. 2020-07-10. Single Event Effects in Field Programmable Gate Array (FPGA) Devices: Update 2020. https://ntrs.nasa.gov/citations/20205003879

Cite the original work for its findings. Save a collection to share your selection of sources.

KEEP EXPLORING

Related reports

NASA Goddard Space Flight Center’s Compendium of Radiation Effects Test Results

Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FETs, flash memory, FPGAs, optoelectronics, digital, analog, and bipolar devices.

Single Event Effects (SEE)