The Value of "Test-As-You-Fly": Modernizing Experimentation and Data Analysis for NASA Missions
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Melanie Berg↗
Engineering topics
Anthony Phan
Publications and source records attributed to Anthony Phan.
NEPP 2021 FPGA Radiation Effects Update: Microchip PolarFire (Single Event Effects) and Lattice Crosslink-NX (Total Ionizing Dose)
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Melanie Berg↗
HSYE-117RH Voltage Linear Regulator Total Ionizing Dose Test Report
The purpose of this test was to validate the Intersil HSYE-117RH-Q flight lot for use in the fabrication of Europa Clipper Propulsion subsystem flight hardware. This test shall serve as the radiation lot acceptance test (RLAT) for the flight lot date with wafer lot number G3X3CQC and lot date code (LDC) 1830. Low dose rate (LDR) irradiations have been performed by the manufacturer, but only to 100 krad(Si). This test determined the enhanced low dose rate sensitivity (ELDRS) of the device up to the mission specific dose of 125 krad(Si).
Total Ionizing Dose (TID)↗
Single Event Effects in Field Programmable Gate Array (FPGA) Devices: Update 2020
An overview of the 2020 single event effects FPGA effort performed by the NASA Electronic Parts and Packaging Group is presented. Information includes Heavy-ion data for the following FPGA devices: Xilinx Kintex-UltraScale and Microsemi PolarFire. Future work is presented.
Single Event Effects (SEE)↗
Update on Wide Bandgap (WBG) Device Radiation Hardness Assurance
This presentation provides an overview of recent wide bandgap device radiation hardness assurance activities at NASA and via NASA-funded grant vehicles. Devices include enhancement mode power GaN HEMTs, RF GaN HEMTs, and SiC MOSFETs and JBS diodes.
wide bandgap↗
Single Event Effects in Field Programmable Gate Array (FPGA) Devices: Update 2020
An overview of the 2020 single event effects FPGA effort performed by the NASA Electronic Parts and Packaging Group is presented. Information includes Heavy-ion data for the following FPGA devices: Xilinx Kintex-UltraScale and Microsemi PolarFire. Future work is presented.
Single Event Effects (SEE)↗
HSYE-117RH Voltage Linear Regulator Total Ionizing Dose Test Report
The purpose of this test was to validate the Intersil HSYE-117RH-Q flight lot for use in the fabrication of Europa Clipper Propulsion subsystem flight hardware. This test shall serve as the radiation lot acceptance test (RLAT) for the flight lot date with wafer lot number G3X3CQC and lot date code (LDC) 1830. Low dose rate (LDR) irradiations have been performed by the manufacturer, but only to 100 krad(Si). This test was a follow-on to the original Radiation Lot-Specific Acceptance Testing (RLAT) performed on this LDC. Application-specific load currents were used for the line regulation and load regulation measurements. All other parameters were measured with standard bias conditions as specified in the datasheet.
Total Ionizing Dose (TID)↗
AD8065 Voltage Feedback Amplifier’s Total Ionizing Dose Characterization Report
The purpose of this testing was to characterize Analog Devices’ AD8065 FastFET amplifier for low-dose rate (LDR) total ionizing dose (TID) response based on the Lucy project requirements and will be used on the L’ORRI instrument being built by Johns Hopkins University Applied Physics Lab. The AD8065 is a voltage feedback amplifier with FET inputs developed with the proprietary eXtra Fast Complementary Bipolar (XFCB) process. The amplifier boasts low noise operation and very high input impedance with a wide supply voltage range.
Megan Casey↗
Xilinx Kintex-Ultrascale Field Programmable Gate Array Single Event Effects (SEE) Heavy-ion Test Report
This report presents 2019 LBNL SEE data and compares previous Texas A&M data to LBNL SEE DUT responses.
Field Programmable Gate Array (FPGA)↗
Total Ionizing Dose Test Report for the LTC6268-10 Operational Amplifier
The purpose of this test is to determine the total-ionizing dose (TID) susceptibility of the LTC6268-10 from Linear Technology Corporation.
TID↗