NASA NTRS · 20150008314
No abstract available
Explore connections, maps & timelines
Guertin, Steven M.. 2013-04-09. SOC SEE Test Guideline Development. https://ntrs.nasa.gov/citations/20150008314
Cite the original work for its findings. Save a collection to share your selection of sources.
KEEP EXPLORING
We present results and analysis investigating the effects of radiation on a variety of candidate spacecraft electronics to heavy ion and proton induced single event effects (SEE), proton-induced displacement damage dose (DDD), and total ionizing dose (TID).
Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices.