NASA NTRS · 20160007752
Silicon Schottky Diode Safe Operating Area
Abstract
Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices.
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Casey, Megan C., Campola, Michael J., Lauenstein, Jean-Marie, Wilcox, Edward P., Phan, Anthony M., LaBel, Kenneth A.. 2016-06-13. Silicon Schottky Diode Safe Operating Area. https://ntrs.nasa.gov/citations/20160007752
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