NASA NTRS · 19670033705
Microinhomogeneity problems in silicon.
Abstract
Electron microscopy analysis of microinhomogeneities in commercial Si used in preparation of p-n junction devices
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Faust, J. W., Jr., John, H. F., Stickler, R.. 1966-09-01. Microinhomogeneity problems in silicon.. https://ntrs.nasa.gov/citations/19670033705
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