TY  - RPRT
TI  - Microinhomogeneity problems in silicon.
AU  - Faust, J. W., Jr.
AU  - John, H. F.
AU  - Stickler, R.
PY  - 1966
UR  - https://ntrs.nasa.gov/citations/19670033705
ID  - 19670033705
ER  -