Microinhomogeneity problems in silicon.
Electron microscopy analysis of microinhomogeneities in commercial Si used in preparation of p-n junction devices
INHOMOGENEITY↗
Engineering topics
John, H. F.
Publications and source records attributed to John, H. F..
A study of the relationship of crystal defects to reliability of epitaxial silicon planar devices summary report, jul. 1964 - jun. 1965
Explore the source record for details and available documents.
Chu, T. L.↗