Device failure analysis by scanning electron microscopy
Scanning electron microscopy for semiconductor device failure analysis
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Scanning electron microscopy for semiconductor device failure analysis
Scanning electron mirror microscope advantages over electron mirror and scanning electron microscopes for examining integrated circuits
Scanning electron microscopy for reliability studies in semiconductor devices
Scanning electron microscopy to study device failure and performance, discussing limitations and progress
Scanning electron microscopy was used in studying the morphology and cathodoluminescence of lunar regolith particles. Surface and structure of two groups of particles are differentiated: (1) Crystalline with well defined facets and spalling surfaces, which are grains of minerals and rock fragments: and (2) amorphous, fused, and partially or entirely glazed particles. Local melting of particles and the round openings on their surfaces are attributed to secondary influence on the regolith of factors of lunar weathering and above all micrometeoric impacts.
Integrated circuit failure analysis with scanning electron microscopy taking into account ball bond contamination and open metallization at contact windows
Feasibility study of scanning electron microscopy to diagnose properties of small Gunn diodes
Methods for analyzing atmospheric aerosols and particulate contaminants from natural and industrial sources are briefly described. Their development was spurred by interest in cosmic dust investigations. These methods make it possible to analyze individual particles ranging in size from 0.01 to 1000 microns for elemental and mineralogical content. The described methods include transmission electron microscopy, scanning electron microscopy, electron probe microanalysis, X-ray diffraction, optical mineralogy, and density measurement.
Examination of Holocene Bahamian ooelites by scanning electron and light microscopy has revealed the morphology and orientation of aragonite crystals in the lamellar ooelitic envelope, and their modification by the boring activities of endolithic algae. The voids produced by these algae are found in progressive stages of being lined and filled with precipitated microcrystalline aragonite, which is similar to the process of micrite envelope formation in molluscan and other skeletal carbonate grains.
Optical and scanning electron microscopy, scanning electron microprobes and energy dispersion techniques were applied in an analysis of six siliceous glass spheres, five siliceous glass-bonded agglutinates and one breccia fragment from Luna 20 sample 22003. It is theorized that local meteor impact processes might have been responsible for the formation of most of the glass spheres and that the impacts of relatively high velocity particles might have been responsible for the craters observed on the surfaces of the spheres. The concentrations of iron spherules on the surfaces of the glass spheres were generally lower than in similar Apollo 11 and 12 glass spheres.
Damage scar volume measurements taken from like metal fretting pairs combined with scanning electron microscopy observations showed that three sequentially operating mechanisms result in the fretting of titanium, Monel-400, and cobalt - 25-percent molybdenum. Initially, adhesion and plastic deformation of the surface played an important role. This was followed after a few hundred cycles by a fatigue mechanism which produced spall-like pits in the damage scar. Finally, a combination of oxidation and abrasion by debris particles became most significant. Damage scar measurements made on several elemental metals after 600,000 fretting cycles suggested that the ratio of oxide hardness to metal hardness was a measure of the susceptibility of a metal to progressive damage by fretting.
Damage scar volume measurements taken from like metal fretting pairs, combined with scanning electron microscopy observations, showed that three sequentially operating mechanisms result in the fretting of titanium, Monel-400, and cobalt-25% molybdenum. Initially, adhesion and plastic deformation on the surface played an important role. This was followed after a few hundred cycles by a fatigue mechanism, producing spall-like pits in the damage scar. Finally, an oxidation-related mechanism became most significant. Damage scar measurements made on several elemental metals after 600,000 fretting cycles suggested that the ratio of oxide hardness to metal hardness was a measure of the susceptibility of a metal to progressive damage by fretting.
BeO whiskers formation on burning Be droplets surface using scanning electron microscopy, noting temperature effects
Cochlear sensory epithelium and Corti organ degeneration after noise exposure in guinea pigs and cats, using scanning electron microscopy
Copper and gold films (0.2 to 2 microns) were ion plated onto polished 304-stainless-steel surfaces. These coatings were examined by scanning electron microscopy for coating growth defects. Three types of defects were distinguished: nodular growth, abnormal or runaway growth, and spits. The cause and origin for each type of defect was traced. Nodular growth is primarily due to inherent substrate microdefects, abnormal or runaway growth is due to external surface inclusions, and spits are due to nonuniform evaporation. All these defects have adverse effects on the coatings. They induce stresses and produce porosity in the coatings and thus weaken their mechanical properties. Friction and wear characteristics are affected by coating defects, since the large nodules are pulled out and additional wear debris is generated.
Composite solid propellants surface structure and profile characteristics burning with various oxidizers and polyurethane binder by scanning electron microscopy
The extension of Hoover's (1971) technique to the case of dihedral-angle measurement is described. Dihedral angles are often determined by interferometry on thermally grooved grain boundaries to obtain information on relative interfacial energies. In the technique considered the measured angles approach the true angles as the tilt angle approaches 90 deg. It is pointed out that the scanning electron microscopy method provides a means of seeing the real root of a groove at a lateral magnification which is higher than that obtainable with interferometry.
A scanning electron microscope study of a fine-grained, pin, Ca-rich inclusion from the Allende meteorite has revealed strong evidence for direct condensation of its constituent minerals from a vapor. This observation extends to the alkali-bearing phases in addition to the Ca-, Al-silicates and suggests that the feldspathoids as well as the refractory silicates are solar nebular condensates.