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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 1,675 records · Page 93
All sourcesNASA NTRSDOE OSTI
NASA NTRS1974

Design considerations for the Shuttle/Orbiter closed-circuit television subsystem

The Shuttle/Orbiter Program requirements relative to operational and performance parameters of the CCTV (closed circuit television) subsystem and their influence upon design considerations are presented. The anticipated use of the CCTV for rendezvous, docking, manipulator arm operation, satellite inspection and general orbiter operations is outlined to establish the performance requirements of each subsystem element. Typical physical characteristics, interface parameters, and remote-control design philosophy are briefly described.

Perry, W. E.↗
NASA NTRS1976

DIP extractor simplifies circuit removal

Easily constructed tool can be used to pull dual in-line packaged integrated circuits off printed-wiring boards without damaging pins. Extractor can be designed for most popular IC configurations and sizes.

Nies, T.↗
NASA NTRS1977

Majority-voted logic fail-sense circuit

Fail-sense circuit has majority-voted logic component which receives three error voltage signals that are sensed at single point by three error amplifiers. If transistor shorts, only one signal is required to operate; if transistor opens, two signals are required.

Mclyman, W. T.↗
NASA NTRS1975

The high current transient generator, theory and operation for simulating lightning induced voltages into aerospace electrical circuits

Because of the difficulty, hazard, and cost of simulating full-scale lightning currents on flight vehicles, a nondestructive test technique using reduced-scale lightning currents was used to determine if threat level voltages will be induced into aircraft electrical circuits in the event the aircraft is actually struck by lightning. The reasoning and theory of selecting a particular simulated lightning waveshape and magnitude is given, showing that extrapolation of induced waveforms over several orders of magnitude should be avoided. The operation of high-current transient generators and hardware are described along with typical applications. The means by which voltages were generated, induced, and measured, as well as possible sources of error, are discussed.

Schulte, E. H.↗
NASA NTRS1975

Testing of printed circuit board solder joints by optical correlation

An optical correlation technique for the nondestructive evaluation of printed circuit board solder joints was evaluated. Reliable indications of induced stress levels in solder joint lead wires are achievable. Definite relations between the inherent strength of a solder joint, with its associated ability to survive stress, are demonstrable.

Espy, P. N.↗
NASA NTRS1976

Accelerated test techniques for micro-circuits: Evaluation of high temperature (473 k - 573 K) accelerated life test techniques as effective microcircuit screening methods

The application of high temperature accelerated test techniques was shown to be an effective method of microcircuit defect screening. Comprehensive microcircuit evaluations and a series of high temperature (473 K to 573 K) life tests demonstrated that a freak or early failure population of surface contaminated devices could be completely screened in thirty two hours of test at an ambient temperature of 523 K. Equivalent screening at 398 K, as prescribed by current Military and NASA specifications, would have required in excess of 1,500 hours of test. All testing was accomplished with a Texas Instruments' 54L10, low power triple-3 input NAND gate manufactured with a titanium- tungsten (Ti-W), Gold (Au) metallization system. A number of design and/or manufacturing anomalies were also noted with the Ti-W, Au metallization system. Further study of the exact nature and cause(s) of these anomalies is recommended prior to the use of microcircuits with Ti-W, Au metallization in long life/high reliability applications. Photomicrographs of tested circuits are included.

Johnson, G. M.↗
NASA NTRS1977

Optical integrated-circuit tester

Computer controlled device can check typical medium scale unit in less than one minute. System scans integrated circuit chip with narrow beam of light while simultaneously scanning reference chip.

Micka, E. A.↗
NASA NTRS1977

"Printed-circuit" rectenna

Rectifying antenna is less bulky structure for absorbing transmitted microwave power and converting it into electrical current. Printed-circuit approach, using microstrip technology and circularly polarized antenna, makes polarization orientation unimportant and allows much smaller arrays for given performance. Innovation is particularly useful with proposed electric vehicles powered by beam microwaves.

Dickinson, R. M.↗
NASA NTRS1977

Circuit regulates voltage of dc-dc converter

Method of regulating voltage-multiplier dc-dc converter utilizes regulating circuit that directly controls only fraction of input voltage, resulting in lightweight, efficient regulator.

Harrigill, W. T., Jr.↗
NASA NTRS1976

Implementation of Large Scale Integrated (LSI) circuit design software

Portions of the Computer Aided Design and Test system, a collection of Large Scale Integrated (LSI) circuit design programs were modified and upgraded. Major modifications were made to the Mask Analysis Program in the form of additional operating commands and file processing options. Modifications were also made to the Artwork Interactive Design System to correct some deficiencies in the original program as well as to add several new command features related to improving the response of AIDS when dealing with large files. The remaining work was concerned with updating various programs within CADAT to incorporate the silicon on sapphire silicon gate technology.

Kuehlthau, R. L.↗
NASA NTRS1976

Errors in short circuit measurements due to spectral mismatch between sunlight and solar simulators

Errors in short circuit current measurement were calculated for a variety of spectral mismatch conditions. The differences in spectral irradiance between terrestrial sunlight and three types of solar simulator were studied, as well as the differences in spectral response between three types of reference solar cells and various test cells. The simulators considered were a short arc xenon lamp AMO sunlight simulator, an ordinary quartz halogen lamp, and an ELH-type quartz halogen lamp. Three types of solar cells studied were a silicon cell, a cadmium sulfide cell and a gallium arsenide cell.

Curtis, H. B.↗
NASA NTRS1977

An integrated circuit floating point accumulator

Goddard Space Flight Center has developed a large scale integrated circuit (type 623) which can perform pulse counting, storage, floating point compression, and serial transmission, using a single monolithic device. Counts of 27 or 19 bits can be converted to transmitted values of 12 or 8 bits respectively. Use of the 623 has resulted in substantial savaings in weight, volume, and dollar resources on at least 11 scientific instruments to be flown on 4 NASA spacecraft. The design, construction, and application of the 623 are described.

Goldsmith, T. C.↗
NASA NTRS1978

Ultrasonic evaluation of high-voltage circuit boards

Ultrasonic transmission technique, using reflector plate, indicates resistance to corona formation. Technique is useful as tool for mapping specific panels to permit selecting best areas of laminate for circuit board use. Procedure is relatively safe, fast, inexpensive, and uses commercially-available equipment.

Klima, S. J.↗
NASA NTRS1979

Automatic gain-balancing circuit

Energy reaching sensor is collected by telescope, modulated by chopper, spectrally filtered, and simultaneously directed onto two detectors. Gains through multiple signal paths are automatically balanced to 1 part in 10,000. Circuit compensates for slow changes in optical and electrical gains common to gas-filter correlation spectrometers.

Eisenhut, D. F.↗
NASA NTRS1979

No-warp potted circuits

Sponge inserts compensate for potting-compound expansion and relieve thermal stresses on circuit boards. Technique quality of production runs on PC boards intended for applications in environments less severe than those for aerospace equipment. Pads reduce weight of modules because they weigh far less than potting compound they displace.

Robinson, W. W.↗
NASA NTRS1979

Circuit-lead trimming template

Template for use in trimming leads on production wiring boards is low-cost means for eliminating rejections for short leads and improving lead-strength uniformity. Template is simply unclad piece of printed-circuit board material that is drilled using same drill control tape used in making original production board. Revisions in component layout of board can therefore be made simultaneously in template.

Ofarrell, K.↗
NASA NTRS1979

Accelerated hybrid-circuit production

Modified die-bonding machine speeds up hybrid-circuit production. Utilizing two pedestals, one for die tray and another for substrate tray, increased production and decreased error-margin are possible.

Berg, J. E.↗