NASA NTRS · 19770000098
Optical integrated-circuit tester
Abstract
Computer controlled device can check typical medium scale unit in less than one minute. System scans integrated circuit chip with narrow beam of light while simultaneously scanning reference chip.
Keep this discovery
Explore connections, maps & timelines
Micka, E. A., Reynolds, R. K.. 1977-06-01. Optical integrated-circuit tester. https://ntrs.nasa.gov/citations/19770000098
Cite the original work for its findings. Save a collection to share your selection of sources.