Failure analysis using a scanning electron microscope.
Component failure modes analysis using scanning electron microscopy, noting applications to study of semiconductors and wire plating anomalies
Anstead, R. J.↗
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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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Tandem-scanning reflected-light microscope.
Microscope using tandem scanning of reflected light for image contrast and sharpness for semitransparent materials
Egger, M. D.↗
The diagnosis of experimental pulmonary aero- emboli following decompression by radio- isotopic lung scanning.
Radioisotopic lung scanning for locating pulmonary aeroemboli following decompression
Cockett, A. T. K.↗
A high resolution scanning confocal interferometer.
High resolution scanning confocal interferometer illumination requirements from quasi-paraxial ray tracing calculation, considering additional reflections effect
Johnson, J. R.↗
A television scanning scheme for a detector- noise-limited system.
TV scanning reticle for improved SNR at detector by receiving light from many picture elements simultaneously, noting fidelity
Gottlieb, P.↗
A passive method for scanning the celestial sphere.
Celestial sphere scanning by passive method applicable to space missions requiring long lifetime and moderate pointing accuracies
Fleig, A. J., Jr.↗
A multiplexer/demultiplexer system for the multicolor spin scan cloud camera on ATS-C.
Multiplexer/demultiplexer system for multicolor spin scan cloud camera on ATS-C, discussing circuit design
Kovar, D. G.↗
A reflector feed system with simultaneous, independent, scanning secondary beams.
Parabolic reflector feed system for spacecraft multiple transmitters and receivers with simultaneous, independent secondary beam scanning
Mills, M. K.↗
Radioisotopic color scanning of pulmonary aeroemboli in experimental decompression sickness - Dysbarism.
Radioisotopic color scanning of pulmonary aeroemboli in decompression sickness, noting dog experiment results and role of dextran infusion in recovery
Cockett, A. T. K.↗
Phase multiplying electronic scanning array
Scanning array was designed with properties of low RF loss and phase control. The array consists of a series of special waveguides, hybrids made up of two variable reactance branch arms for input signals, an edge slot for the difference port, and a sum arm for the unradiated signal.
Seaton, A. F.↗
A scanning polarimeter
Optical system of scanning polarimeter with improved photoelectric resolution
Hall, J. S.↗
Photoelectric observations of Mars and Jupiter with a scanning polarimeter
Photoelectric observations of Mars and Jupiter with scanning polarimeter
Hall, J. S.↗
Mechanical design of the spin-scan cloud camera
Mechanical design and performance of spin-scan camera for cloud photography
Upton, D. T.↗
The application of the scanning electron microscope to studies of current multiplication, avalanche breakdown and thermal runaway. Part 1 - General physical basis
Scanning electron microscope applications in study of current multiplication, avalanche breakdown, and thermal runaway - Physical basis
Shaw, D. A.↗
The application of the scanning electron microscope to studies of current multiplication, avalanche breakdown and thermal runaway. Part 2 - General studies, mainly non-thermal
Scanning electron microscope applications in study of current multiplication, avalanche breakdown, and thermal runaway - Nonthermal effects in Read diodes
Sulway, D. V.↗
The application of the scanning electron microscope to studies of current multiplication, avalanche breakdown and thermal runaway. Part 3 - Thermal runaway in multi-emitter power transistors
Scanning electron microscopy applications in study of thermal runaway in multi-emitter power transistors
Sulway, D. V.↗
Device failure analysis by scanning electron microscopy
Scanning electron microscopy for semiconductor device failure analysis
Davies, I. G.↗
Development of a continous scanning laminograph Final report, 20 Jun. 1966 - 30 Jun. 1968
Continuous scanning X ray laminograph for nondestructive testing of multilayer printed circuits
Moler, R. B.↗