NASA NTRS · 19680046272
Failure analysis using a scanning electron microscope.
Abstract
Component failure modes analysis using scanning electron microscopy, noting applications to study of semiconductors and wire plating anomalies
Keep this discovery
Explore connections, maps & timelines
Anstead, R. J.. 1968-01-01. Failure analysis using a scanning electron microscope.. https://ntrs.nasa.gov/citations/19680046272
Cite the original work for its findings. Save a collection to share your selection of sources.