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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 397 records · Page 22
All sourcesNASA NTRSDOE OSTI
NASA NTRS1971

Investigation of intermittent enhancement of ion emission from a tungsten surface using the field-ion microscope.

The blinking effect, or the intermittent enhancement of ion emission, which is observed when a few parts per million neon are added to the imaging gas in a helium-tungsten field-ion microscope, has been investigated. Measurements of the characteristic quantities involved - i.e., blinking rate, voltage limits, etc. - and their variation with temperature, field, and gas pressure, are described.

Weizer, V. G.↗
NASA NTRS1972

Ion and laser microprobes applied to the measurement of corrosion produced hydrogen on a microscopic scale.

Use of an ion microprobe and a laser microprobe to measure concentrations of corrosion-produced hydrogen on a microscopic scale. Hydrogen concentrations of several thousand ppm were measured by both analytical techniques below corroded and fracture surfaces of hot salt stress corroded titanium alloy specimens. This extremely high concentration compares with only about 100 ppm hydrogen determined by standard vacuum fusion chemical analyses of bulk samples. Both the ion and laser microprobes were used to measure hydrogen concentration profiles in stepped intervals to substantial depths below the original corroded and fracture surfaces. For the ion microprobe, the area of local analysis was 22 microns in diameter and for the laser microprobe, the area of local analysis was about 300 microns in diameter. The segregation of hydrogen below fracture surfaces supports a previously proposed theory that corrosion-produced hydrogen is responsible for hot salt stress corrosion embrittlement and cracking of titanium alloys. These advanced analytical techniques suggest great potential for many areas of stress corrosion and hydrogen embrittlement research, quality control, and field inspection of corrosion problems. For example, it appears possible that a contour map of hydrogen distribution at notch roots and crack tips could be quantitatively determined. Such information would be useful in substantiating current theories of stress corrosion and hydrogen embrittlement.

Gray, H. R.↗
NASA NTRS1972

Profiling with the electron microscope.

Discussion of a profiling technique using a scanning electron microscope for obtaining depth information on a single micrograph of a small specimen. A stationary electron beam is used to form a series of contamination spots in a line across the specimen. Micrographs obtained by this technique are useful as a means of projection and display where stereo viewers are not practical.

Vedder, J. F.↗
NASA NTRS1971

In-situ measurement of objective lens data of a high-resolution electron microscope.

Bragg-reflex images of small individual crystallites in the size range of 20-100 A diameter with known crystallographic orientation were used in a transmission electron microscope to determine in-situ: (a) the relationship between objective lens current (or accelerating voltage) changes in discrete steps and corresponding defocus, (b) the spherical aberration coefficient, and (c) the axial chromatic aberration coefficient of the objective lens. The accuracy of the described method is better than 5%. The same specimen can advantageously be used to properly aline the illuminating beam with respect to the optical axis.

Heinemann, K.↗
NASA NTRS1972

Study of excess Fe metal in the lunar fines by magnetic separation, Moessbauer spectroscopy, and microscopic examination.

A simple and convenient method of making quantitative magnetic separations has been applied to the lunar fines. The fractions obtained form groups containing distinctively different particle types; thus, it appears that magnetic separation in itself many be a useful way of characterizing lunar fines. Moessbauer studies of fines 10084 show that the metal cannot contain more than about 1.5% Ni, implying that by far the bulk of the metal results from reduction rather than from direct meteoritic addition. Microscopic examination of magnetic separates from 15101 fines suggests that reduction of Fe accompanies every major impact event on the moon.

Housley, R. M.↗
NASA NTRS1973

A microscopic study of crack initiation mechanisms in 7075 aluminum alloy sheets.

A study of the opening mode of crack initiation in 7075-T6 aluminum alloy sheets has been conducted with the aid of a scanning electron microscope. Observations were made from several orientations, including the top view of the specimen which showed the notch profile and the edge view of the specimen which showed the entire notch front along the specimen thickness. It was found that the edge view exhibited the first signs of permanent deformation at about 55% of the breaking strength. These changes took the form of deformation bands which were aligned in the direction of the tensile axis and apparently defined limiting regions of homogeneous slip. It is felt that the appearance of microcracks at loads approaching the breaking strength was of fundamental importance in the formation of the final fracture surface. Many of these microcraks were initiated at intermetallic particles and other metallurgically weak regions on the notch surface. It was also possible to correlate the strain in the notch with the stress intensity factor for the various loads. Very large plastic strains were observed on the notch tip as compared to published values of elongation at fracture for unnotched specimens.

Jones, D. L.↗
NASA NTRS1974

Influence of ultrasounds on some mechanical properties of fir wood (Abies alba Mill). Microscopic sections

It was found that as a result of ultrasonic treatment fir wood (Abies alba Mill) shows the effects of homogenization, and the modulus of elasticity for static flexure drops on an average by 50% for 45 min of treatment. The drop is more pronounced for test pieces with 8 to 12 annual rings. Study of microscopic sections disclosed that early wood with one annual ring undergoes the most powerful effect.

Parpala, V.↗
NASA NTRS1974

Dynamic-scanning-electron-microscope study of friction and wear

A friction and wear apparatus was built into a real time scanning electron microscope (SEM). The apparatus and SEM comprise a system which provides the capability of performing dynamic friction and wear experiments in situ. When the system is used in conjunction with dispersive X-ray analysis, a wide range of information on the wearing process can be obtained. The type of wear and variation with speed, load, and time can be investigated. The source, size, and distribution of wear particles can be determined and metallic transferal observed. Some typical results obtained with aluminum, copper, and iron specimens are given.

Brainard, W. A.↗
NASA NTRS1974

Method of forming aperture plate for electron microscope

An electron microscope is described with an electron source a condenser lens having either a circular aperture for focusing a solid cone of electrons onto a specimen or an annular aperture for focusing a hollow cone of electrons onto the specimen. It also has objective lens with an annular objective aperture, for focusing electrons passing through the specimen onto an image plane. A method of making the annular objective aperture using electron imaging, electrolytic deposition and ion etching techniques is included.

Heinemann, K.↗
NASA NTRS1975

Diffusion length measurements using the scanning electron microscope

A measurement technique employing the scanning electron microscope is described in which values of the true bulk diffusion length are obtained. It is shown that surface recombination effects can be eliminated through the application of highly doped surface field layers. The influence of high injection level effects and low-high junction current generation on the resulting measurement was investigated. Close agreement is found between the diffusion lengths measured by this method and those obtained using a penetrating radiation technique.

Weizer, V. G.↗
NASA NTRS1974

Microscopic plasma Hamiltonian

A Hamiltonian for the microscopic plasma model is derived from the Low Lagrangian after the dual roles of the generalized variables are taken into account. The resulting Hamilton equations are shown to agree with the Euler-Lagrange equations of the Low Lagrangian.

Peng, Y.-K. M.↗
NASA NTRS1975

Diffusion length measurement using the scanning electron microscope

The present work describes a measuring technique employing the scanning electron microscope in which values of the true bulk diffusion length are obtained. It is shown that surface recombination effects can be eliminated through application of highly doped surface field layers. The effects of high injection level and low-high junction current generation are investigated. Results obtained with this technique are compared to those obtained by a penetrating radiation (X-ray) method, and a close agreement is found. The SEM technique is limited to cells that contain a back surface field layer.

Weizer, V. G.↗
NASA NTRS1975

Oxide nucleation on thin films of copper during in situ oxidation in an electron microscope

Single-crystal copper thin films were oxidized at an isothermal temperature of 425 C and at an oxygen partial pressure of 0.005 torr. Specimens were prepared by epitaxial vapor deposition onto polished faces of rocksalt and were mounted in a hot stage inside the ultrahigh-vacuum chamber of a high-resolution electron microscope. An induction period of roughly 30 min was established which was independent of the film thickness but depended strongly on the oxygen partial pressure and to exposure to oxygen prior to oxidation. Neither stacking faults nor dislocations were found to be associated with the Cu2O nucleation sites. The experimental data, including results from oxygen dissolution experiments and from repetitive oxidation-reduction-oxidation sequences, fit well into the framework of an oxidation process involving the formation of a surface charge layer, oxygen saturation of the metal with formation of a supersaturated zone near the surface, and nucleation followed by surface diffusion of oxygen and bulk diffusion of copper for lateral and vertical oxide growth, respectively.

Heinemann, K.↗
NASA NTRS1977

High-resolution electron microscope

Employing scanning transmission electron microscope as interferometer, relative phases of diffraction maximums can be determined by analysis of dark field images. Synthetic aperture technique and Fourier-transform computer processing of amplitude and phase information provide high resolution images at approximately one angstrom.

Nathan, R.↗
NASA NTRS1976

Modification of Moore measuring machine/Leitz microscope

Quality assurance mechanical inspection, anticipating the need for improved measuring techniques for the various laboratory programs, has perfected a modification of the Leitz microscope for the Moore measuring machine that has the capability of significantly reducing inspection time with increased reliability.

Greth, H. A.↗
NASA NTRS1976

Computer measurement of particle sizes in electron microscope images

Computer image processing techniques have been applied to particle counting and sizing in electron microscope images. Distributions of particle sizes were computed for several images and compared to manually computed distributions. The results of these experiments indicate that automatic particle counting within a reasonable error and computer processing time is feasible. The significance of the results is that the tedious task of manually counting a large number of particles can be eliminated while still providing the scientist with accurate results.

Hall, E. L.↗
NASA NTRS1976

Microscopic aspects of interfacial reactions in diffusion bonding processes

Microscopic aspects of interfacial reactions are discussed, such as interdiffusion, formation of intermetallic phases, generation and annihilation of lattice defects, effect of temperature, grain size, etc., which normally occur in diffusion bonding processes. Relationships between properties and microstructure in thin film couples are examined utilizing a unique combination of contact resistance measurements and characterization by transmission electron microscopy.

Shearer, M. P.↗