NASA NTRS · 19760000499
High-resolution electron microscope
Abstract
Employing scanning transmission electron microscope as interferometer, relative phases of diffraction maximums can be determined by analysis of dark field images. Synthetic aperture technique and Fourier-transform computer processing of amplitude and phase information provide high resolution images at approximately one angstrom.
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Nathan, R.. 1977-03-01. High-resolution electron microscope. https://ntrs.nasa.gov/citations/19760000499
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