DOE OSTI · 3364052
Extracting Circuit Parameters from Multimodal Cavities for Lumped Element Simulations
Abstract
The source did not provide an abstract. Follow the original record for more information.
Keep this discovery
Explore connections, maps & timelines
Eyre, Christopher Kendal [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)], Cartwright, Keith [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:000000032075200X), Camacho, Ryan [Brigham Young University]. 2025-05-01. Extracting Circuit Parameters from Multimodal Cavities for Lumped Element Simulations. https://doi.org/10.2172/3364052
Cite the original work for its findings. Save a collection to share your selection of sources.