TY  - RPRT
TI  - Extracting Circuit Parameters from Multimodal Cavities for Lumped Element Simulations
AU  - Eyre, Christopher Kendal [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)]
AU  - Cartwright, Keith [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:000000032075200X)
AU  - Camacho, Ryan [Brigham Young University]
PY  - 2025
DO  - 10.2172/3364052
UR  - https://www.osti.gov/biblio/3364052
ID  - 3364052
ER  -