@misc{indiciaee372decf4393,
  title = {Extracting Circuit Parameters from Multimodal Cavities for Lumped Element Simulations},
  author = {Eyre, Christopher Kendal [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] and Cartwright, Keith [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:000000032075200X) and Camacho, Ryan [Brigham Young University]},
  year = {2025},
  doi = {10.2172/3364052},
  url = {https://www.osti.gov/biblio/3364052},
  note = {Source identifier: 3364052}
}