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DOE OSTI · 3011571

Simulation driven adaptive sampling for neutron-diffraction based strain mapping of additively manufactured parts

Abstract

Neutron diffraction based strain mapping is a useful technique for measuring residual strains in additively manufactured (AM) metal parts. The measurement is traditionally done by scanning the sample in a point-wise raster pattern to extract the strain at each position. Since the overall scan can span several hours, adaptive sampling approaches using Bayesian optimization based on Gaussian process (BO-GP) regression have been introduced—demonstrating that even with a fraction of the typically made measurements the dominant strain patterns in the sample can be reconstructed. However, the parameters of the BO-GP algorithm have to be carefully chosen for best performance, and the movement time between arbitrary points can offset the time savings from a reduced number of measurement locations. In this paper, we propose algorithms to refine the BO-GP based methods by using simulations of strain patterns in AM parts based on the materials and the process used to print them. We demonstrate that the simulated strain patterns can be used to help choose better parameters for the BO-GP based framework—leading to low reconstruction error for the final strain pattern. Furthermore, we show that the strain mapping experiment can be initialized with a sampling pattern learnt from the simulation data and ordered to reduce movement time, dramatically enabling reduction in the overall time required to run the baseline BO-GP method.

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Vaidyanathan, Venkatakrishnan Singanallur [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000276374987), An, Ke [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:000000026093429X), Lee, Yousub [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000255630419), Feldhausen, Thomas [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000273115189), Heinrich, Lauren [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000306509011), DeWitt, Stephen [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:000000029550293X). 2025-11-06. Simulation driven adaptive sampling for neutron-diffraction based strain mapping of additively manufactured parts. https://doi.org/10.1088/2632-2153%2Fae0ff2

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