TY  - RPRT
TI  - Simulation driven adaptive sampling for neutron-diffraction based strain mapping of additively manufactured parts
AU  - Vaidyanathan, Venkatakrishnan Singanallur [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000276374987)
AU  - An, Ke [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:000000026093429X)
AU  - Lee, Yousub [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000255630419)
AU  - Feldhausen, Thomas [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000273115189)
AU  - Heinrich, Lauren [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000306509011)
AU  - DeWitt, Stephen [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:000000029550293X)
PY  - 2025
DO  - 10.1088/2632-2153/ae0ff2
UR  - https://www.osti.gov/biblio/3011571
ID  - 3011571
ER  -