@misc{indiciae51053853dd81,
  title = {Simulation driven adaptive sampling for neutron-diffraction based strain mapping of additively manufactured parts},
  author = {Vaidyanathan, Venkatakrishnan Singanallur [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000276374987) and An, Ke [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:000000026093429X) and Lee, Yousub [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000255630419) and Feldhausen, Thomas [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000273115189) and Heinrich, Lauren [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000306509011) and DeWitt, Stephen [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:000000029550293X)},
  year = {2025},
  doi = {10.1088/2632-2153/ae0ff2},
  url = {https://www.osti.gov/biblio/3011571},
  note = {Source identifier: 3011571}
}