DOE OSTI · 2999946
Impact of amorphous pockets on displacement damage evolution in silicon
Abstract
Silicon has long been known to exhibit amorphization in response to heavy particle bombardment. For doses below the total amorphization threshold, partial amorphization is observed in the form of scattered amorphous pockets. While extensive research has gone into modeling the formation and evolution of amorphous pockets in response to irradiation, no studies yet investigate their impact on the evolution of other damage such as interstitial supersaturation and clustering. In this study, we survey the impact of amorphous pockets on defect evolution in silicon when treated as static sinks. MD is first used to show that amorphous pockets provide energetically favorable sites for point defects relative to the crystalline bulk, supporting the hypothesis that they act as sinks. A 0-D cluster dynamics model is then constructed, taking an interstitial clustering model from the literature and including amorphous pockets as a sink species. We conduct our survey for temperatures between 30 and 400 °C and sink strengths between 1 to 6 x 10 10 cm −2 . Both implantation- and radiation-induced damage states are investigated using interstitial and vacancy concentrations as initial condition variables. We find that, due to the differing migration rates of the interstitial and the vacancy, amorphous pockets have a non-monotonic impact on the final damage state depending on the effective sink strength of the amorphous pockets, resulting in increased damage formation in regimes of intermediate amorphization. In conclusion, this result emphasizes the important role of amorphous pockets in governing the evolution of damage in partially amorphized crystalline materials.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Little, Henry Richard [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States); Air Force Institute of Technology, Wright-Patterson AFB, OH (United States)] (ORCID:0009000447167470), Uberuaga, Blas P. [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)] (ORCID:0000000169346219), Matthews, Christopher [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)] (ORCID:0000000314681348), Liu, Xiang-Yang [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)] (ORCID:0000000341833802), Lenyk, Christopher A. [Air Force Institute of Technology, Wright-Patterson AFB, OH (United States)] (ORCID:0000000271086046). 2025-09-24. Impact of amorphous pockets on displacement damage evolution in silicon. https://doi.org/10.1016/j.commatsci.2025.114255
Cite the original work for its findings. Save a collection to share your selection of sources.