TY  - RPRT
TI  - Impact of amorphous pockets on displacement damage evolution in silicon
AU  - Little, Henry Richard [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States); Air Force Institute of Technology, Wright-Patterson AFB, OH (United States)] (ORCID:0009000447167470)
AU  - Uberuaga, Blas P. [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)] (ORCID:0000000169346219)
AU  - Matthews, Christopher [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)] (ORCID:0000000314681348)
AU  - Liu, Xiang-Yang [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)] (ORCID:0000000341833802)
AU  - Lenyk, Christopher A. [Air Force Institute of Technology, Wright-Patterson AFB, OH (United States)] (ORCID:0000000271086046)
PY  - 2025
DO  - 10.1016/j.commatsci.2025.114255
UR  - https://www.osti.gov/biblio/2999946
ID  - 2999946
ER  -