@misc{indiciae04778cbbcc63,
  title = {Impact of amorphous pockets on displacement damage evolution in silicon},
  author = {Little, Henry Richard [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States); Air Force Institute of Technology, Wright-Patterson AFB, OH (United States)] (ORCID:0009000447167470) and Uberuaga, Blas P. [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)] (ORCID:0000000169346219) and Matthews, Christopher [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)] (ORCID:0000000314681348) and Liu, Xiang-Yang [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)] (ORCID:0000000341833802) and Lenyk, Christopher A. [Air Force Institute of Technology, Wright-Patterson AFB, OH (United States)] (ORCID:0000000271086046)},
  year = {2025},
  doi = {10.1016/j.commatsci.2025.114255},
  url = {https://www.osti.gov/biblio/2999946},
  note = {Source identifier: 2999946}
}