DOE OSTI · 1898598
Current Status of Developing Ultrafast Mega-electron-volt Electron Microsope
Abstract
Recent studies of ultrafast electron microscopy (UEM) techniques show the use of short bunches of relativistic electrons is promising for the development of a new instrument for imaging various materials. Compared to conventional electron microscopes, the main advantage of UEMs with the electron energy of a few MeV is the possibility to study thick samples. We will discuss the progress of UEM design to date, the principal challenges on the way to a high resolution, and possible methods for their mitigation including the design of low-aberration magnetic optics, RF and mechanical subsystems with high stability, and precise collimation of electrons scattered in the samples.
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Yang, Xi, Smaluk, Victor, Shaftan, Timur, Wang, Liguo, McSweeney, Sean, Yu, Lihua, Tiwari, Ganesh, Hidaka, Yoshiteru, Wang, Guimei, Doom, Lewis, Rose, Jim, Bergman, David, Fulkerson, Michael, Ganetis, George, Kosciuk, Bernard, Padrazo, Danny, Bacha, Belkacem, Spataro, Charles, Wilson, King, Fedurin, Mikhail, Babzien, Marcus, Malone, Robert, Kusche, Karl, Cullen, Christian, Li, Junjie, Wu, Lijun, Zhu, Yimei, Cultrera, Luca, Liu, Qun, Wan, Weishi. 2022-09-30. Current Status of Developing Ultrafast Mega-electron-volt Electron Microsope. https://doi.org/10.2172/1898598
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