Engineering topics

Hidaka, Yoshiteru

Publications and source records attributed to Hidaka, Yoshiteru.

3 records

DOE OSTI2024

Linear optics compensation for the HEX superconducting wiggler at NSLS-II

At the NSLS-II ring, a 1.2 m long superconducting wiggler with the maximum 4.34T magnetic field has been installed at a low-β straight section (cell 27) to drive the high energy engineering X-ray scattering (HEX) beamline. To mitigate the potential performance degradation due to the linear optics distortion, a local compensation scheme was adopted and confirmed with the online beam measurement. A feedforward control to enable a dynamic compensation of the linear optics distortion was deployed. It can maintain the storage ring lattice performance when the device main coil current ramps.

36 MATERIALS SCIENCE↗

DOE OSTI2022

Systematic Errors Induced by Dipole Component Change in Quadrupole Beam-Based Alignment Measurements for Circular Accelerators

Beam-based alignment (BBA) for quadrupole magnets is now a well-established process for circular accelerators to steer beam orbit through the magnetic centers such that beam orbit is not disturbed when the gradients of quadrupoles are changed. At some facilities, the centers estimated from BBA techniques are also used as a proxy for steering beam through the centers of nearby nonlinear magnets to minimize degradation of nonlinear dynamics caused by off-centered orbit. The random errors associated with BBA are well known, but very little attention has been paid to the systematic error generated by a dipole component change, or equivalently a shift in the magnetic center, when the quadrupole strength is varied. The analytical formulas for this error and its amplification factor (potentially a few orders of magnitude) with respect to the magnetic center motion have been derived and confirmed with simulations. We address the significance of this error as well as the part that cannot be estimated from the beam-based measurement alone. Finally, the BBA measurements obtained at NSLS-II and their systematic errors on the order of hundreds of microns are discussed.

43 PARTICLE ACCELERATORS↗

DOE OSTI2022

Current Status of Developing Ultrafast Mega-electron-volt Electron Microsope

Recent studies of ultrafast electron microscopy (UEM) techniques show the use of short bunches of relativistic electrons is promising for the development of a new instrument for imaging various materials. Compared to conventional electron microscopes, the main advantage of UEMs with the electron energy of a few MeV is the possibility to study thick samples. We will discuss the progress of UEM design to date, the principal challenges on the way to a high resolution, and possible methods for their mitigation including the design of low-aberration magnetic optics, RF and mechanical subsystems with high stability, and precise collimation of electrons scattered in the samples.

43 PARTICLE ACCELERATORS↗