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Malone, Robert

Publications and source records attributed to Malone, Robert.

4 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2024

Hard X-ray inverse Compton scattering at photon energy of 87.5 keV

Abstract Production of hard X-ray via inverse Compton scattering at photon energies below 100 keV range aimed at potential applications in medicine and material research is reported. Experiments have been performed at the Brookhaven National Laboratory, Accelerator Test Facility, employing the counter collision of a 70 MeV, 0.3 nC electron beam with a near infra-red Nd: YAG laser (1064 nm wavelength) pulse containing ~ 100 mJ in a single shot basis. The radiation distribution of the scattered photon beam is assessed to be sufficiently quasi monochromatic to produce clear contrast from the Au K - edge at 80.7 keV.

43 PARTICLE ACCELERATORS↗
DOE OSTI2023

Our teams design high-resolution MeV x-ray radiography systems for National security missions [Poster]

The NNSS has been at the forefront of custom high-fidelity x-ray/gamma radiographic imaging solutions that serve our national security for over five decades. Our radiography team utilizes expertise in physics modeling and analysis, along with optical, mechanical, and electrical design, in close collaboration with our customers, to develop imaging methods and capabilities that go beyond their needs. Conceptual designs are developed through R&D efforts to provide solutions for the specific problem at hand. Field systems are designed and built in-house, then qualified utilizing a range of facilities across the National Security Enterprise. Radiographic imaging systems are deployed by our team in the most challenging environments. The NNSS has a strong math and programming team that provides novel on-site image analysis methods that extract crucial information from data returned in field tests.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
DOE OSTI2022

Current Status of Developing Ultrafast Mega-electron-volt Electron Microsope

Recent studies of ultrafast electron microscopy (UEM) techniques show the use of short bunches of relativistic electrons is promising for the development of a new instrument for imaging various materials. Compared to conventional electron microscopes, the main advantage of UEMs with the electron energy of a few MeV is the possibility to study thick samples. We will discuss the progress of UEM design to date, the principal challenges on the way to a high resolution, and possible methods for their mitigation including the design of low-aberration magnetic optics, RF and mechanical subsystems with high stability, and precise collimation of electrons scattered in the samples.

43 PARTICLE ACCELERATORS↗