NASA NTRS · 20210013816
SRAM-based FPGA: high dose test methods using evaluation boards
Abstract
We present low-cost and effective methods and results for high levels of Total Ionizing Dose testing performed on the Xilinx Kintex UltraScale (20nm) Field-Programmable Gate Array evaluation board using 60Co and 2 MeV electron sources.
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Thorbourn, Dennis, Allen, Gregory R., Vartanian, Sergeh. 2019-09-16. SRAM-based FPGA: high dose test methods using evaluation boards. https://ntrs.nasa.gov/citations/20210013816
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