Engineering topics

Vartanian, Sergeh

Publications and source records attributed to Vartanian, Sergeh.

16 records

NASA NTRS2022

Radiation Effects Characterization and System Architecture Options for the 7nm Snapdragon SA8155P Automotive Grade System on Chip (SoC)

The SA8155P SoC is a complex heterogeneous computational platform with CPUs, GPU, DSPs and NPU. The SA8155P is a 7 TOPS/7 Watts capable AI/ML platform and as such represents a game changing breakthrough in terms computational power for space applications. We characterize the TID and SEE effects of the Qualcomm SA8155P Automotive grade SoC. Individual sub-system testing as well as application specific full device testing was conducted. We also discuss the commercial and automotive recovery mechanisms that are available with the SA8155P SoC generation and how those can form the basis for resilient architecture options for use in future space missions

Allen, Greg↗

NASA NTRS2021

Single Event Effects Characterization of the ST-DDR4 Spin-transfer Torque Magnetoresistive Random Access Memory (STT-MRAM)

We present single event effects (SEE) evaluation of the Everspin Technologies 1Gb non-volatile ST-DDR4 spin-transfer torque MRAM.

Olsen, Andy↗

NASA NTRS2020

Single Event Latchup Results for COTS Devices Used on SmallSat Missions

UNKNOWN

"O'Connor, Michael"↗

NASA NTRS2020

Mission Assurance Approaches and Results for a Proposed Commercial Off-the Shelf (COTS) Mars Mission: Mars Helicopter

UNKNOWN

Nguyen, Tien↗

NASA NTRS2019

SRAM-based FPGA: high dose test methods using evaluation boards

We present low-cost and effective methods and results for high levels of Total Ionizing Dose testing performed on the Xilinx Kintex UltraScale (20nm) Field-Programmable Gate Array evaluation board using 60Co and 2 MeV electron sources.

Thorbourn, Dennis↗

NASA NTRS2019

Single Event Effects (SEE) and Total Ionizing Dose (TID) test results for a step-down regulator controller evaluated for use in a harsh space radiation environment

This paper reports and analyzes recent single event effects (SEE) and total ionizing dose (TID) test results for the Analog Devices RH3845 synchronous current mode step-down controller. This device has been tested and evaluated for use in a harsh space radiation environment.

Merida, Elvis W.↗

NASA NTRS2019

Bit Errors Induced by Internal Electrostatic Discharge on SpaceWire

UNKNOWN

Thorbourn, Dennis↗

NASA NTRS2019

Bit errors induced by internal electrostatic discharge on SpaceWire

UNKNOWN

Thorbourn, Dennis↗

NASA NTRS2018

Single Event Effects Characterization of Dosed UT200SpWPHY01 SpaceWire Physical Layer Transceiver

We present SEE test results for the Cobham SpaceWire transceiver after dosing the device to 300 krad(Si). We performed SEU characterization with variable data rates and patterns. Events resembling SEFIs were also observed and recorded.

Scheick, Leif Z.↗

NASA NTRS2018

Single-Event Latchup Measurements on Wireless and Powerline Network Communication Devices for Use in Mars Missions

This paper reports recent single-event latchup results for a variety of microelectronic devices that include Wireless and Powerline Network Communication devices. The data were collected to evaluate these devices for possible use in NASA Mars missions.

Allen, Gregory R.↗

NASA NTRS2017

Destructive single-events and latchup in radiation-hardened switching regulators

Single-event destructive behavior and latchup has been observed in two separate radiation hardened switching regulators. We discuss the test conditions and observed results.

Pearce, Larry↗

NASA NTRS2017

SEE testing of the Snapdragon 820: on-site annealing and POP challenges

UNKNOWN

Cui, Matthew↗

NASA NTRS2017

Destructive Single-Events and Latchup in Radiation-Hardened Switching Regulators

Single-event destructive behavior and latchup has been observed in two separate radiation-hardened switching regulators. We discuss the test conditions and observed results.

Pearce, Larry↗

NASA NTRS2017

Single-Event Latchup Measurements on COTS Electronic Devices for Use in ISS Payloads

This paper reports recent single-event latchup results for a variety of microelectronic devices that include an ADC, OpAmp, EEPROM, CPLD, PWM, transceiver, voltage regulator, digital signal processor, step-down converter, buck controller and supervisory circuits. The data were collected to evaluate these devices for possible use in NASA ISS payloads.

Irom, Farokh↗

NASA NTRS2017

Snapdragon 820 SEE testing and on-site stuck bit mitigation

UNKNOWN

Cui, Matthew↗

NASA NTRS2015

Radiation Test Results for Common CubeSat Microcontrollers and Microprocessors

SEL, SEU, and TID results are presented for microcontrollers and microprocessors of interest for small satellite systems such as the TI MSP430F1611, MSP430F1612 and MSP430FR5739, Microchip PIC24F256GA110 and dsPIC33FJ256GP710, Atmel AT91SAM9G20, and Intel Atom E620T, and the Qualcomm Snapdragon APQ8064.

Guertin, Steven M.↗