NASA NTRS · 20170006039
Destructive Single-Event Effects in Diodes
Abstract
In this work, we discuss the observed single-event effects in a variety of types of diodes. In addition, we conduct failure analysis on several Schottky diodes that were heavy-ion irradiated. High- and low-magnitude optical microscope images, infrared camera images, and scanning electron microscope images are used to identify and describe the failure locations.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Casey, Megan C., Lauenstein, Jean-Marie, Campola, Michael J., Wilcox, Edward P., Phan, Anthony M., Label, Kenneth A.. 2017-06-26. Destructive Single-Event Effects in Diodes. https://ntrs.nasa.gov/citations/20170006039
Cite the original work for its findings. Save a collection to share your selection of sources.