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Campola, Michael J.

Publications and source records attributed to Campola, Michael J..

At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS2019

Radiation Hardness Assurance: Evolving for NewSpace

During the past decade, numerous small satellites have been launched into space, with dramatically expanded dependence on advanced commercial-off-the-shelf (COTS) technologies and systems required for mission success. While the radiation effects vulnerabilities of small satellites are the same as those of their larger, traditional relatives, revised approaches are needed for risk management because of differences in technical requirements and programmatic resources. While moving to COTS components and systems may reduce direct costs and procurement lead times, it undermines many cost-reduction strategies used for conventional radiation hardness assurance (RHA). Limited resources are accompanied by a lack of radiation testing and analysis, which can pose significant risks - or worse, be neglected altogether. Small satellites have benefited from short mission durations in low Earth orbits with respect to their radiation response, but as mission objectives grow and become reliant on advanced technologies operating for longer and in harsher environments, requirements need to reflect the changing scope without hindering developers that provide new capabilities.

Radiation Hardness Assurance (RHA)↗
NASA NTRS2019

Radiation Hardness Assurance: Evolving for NewSpace

During the past decade, government agencies, private companies and academic institutions, have launched hundreds of small satellites into space, with dramatically expanded dependence on advanced commercial-off-the-shelf (COTS) technologies and systems required for mission success. While the radiation effects vulnerabilities of components within small satellites are the same as those of their larger, traditional relatives, revised approaches are needed for risk management because of differences in technical requirements and programmatic resources. While moving to COTS components and systems may reduce direct costs and procurement lead times, it undermines many cost-reduction strategies used for conventional radiation hardness assurance (RHA). Limited resources are accompanied by a lack of radiation testing and analysis, which can pose significant risks. Small satellites have benefited from short mission durations in low Earth orbits with respect to their radiation response, but as mission objectives grow and become reliant on advanced technologies operating for longer and in harsher environments, requirements need to reflect the changing scope without hindering developers that provide new capabilities. In this course we suggest RHA strategies that engineers and scientists can apply to a wide range of aerospace systems, including constellations, with a focus on how to manage aggressive system scaling for smaller platforms.

Radiation Hardness Assurance (RHA)↗
NASA NTRS2019

Radiation Hardness Assurance: Evolving for NewSpace

During the past decade, numerous small satellites have been launched into space, with dramatically expanded dependence on advanced commercial-off-the-shelf (COTS) technologies and systems required for mission success. While the radiation effects vulnerabilities of small satellites are the same as those of their larger, traditional relatives, revised approaches are needed for risk management because of differences in technical requirements and programmatic resources. While moving to COTS components and systems may reduce direct costs and procurement lead times, it undermines many cost-reduction strategies used for conventional radiation hardness assurance (RHA). Limited resources are accompanied by a lack of radiation testing and analysis, which can pose significant risks—or worse, be neglected altogether. Small satellites have benefited from short mission durations in low Earth orbits with respect to their radiation response, but as mission objectives grow and become reliant on advanced technologies operating for longer and in harsher environments, requirements need to reflect the changing scope without hindering developers that provide new capabilities.

Radiation Hardness Assurance (RHA)↗
NASA NTRS2019

Modern Hardness Assurance: A Brand New Game Except When it Isn't

Mission success criteria at the device level and required device operation/availability can determine the risk posed by the radiation effects for a given device in a given environment, but rarely are the same from one mission to another. A large portion of New Space / SmallSat missions to date have benefitted from relatively short mission durations and chosen orbits that have less severe particle populations than their larger counterparts. As mission objectives grow and become reliant on their chosen devices operating for longer lives and in more harsh environments, requirements need to reflect the changing scope but not hinder design adoptions from previously successful missions that provide new capabilities. This presentation describes notable differences in radiation environments, the requirement changes that come with choice of orbit, and prioritizations for mission success criteria to be determined by the designers of the system and subsystems. Test methodologies based on radiation effect categories are explained briefly; when they are needed. Similarity data (and its limitations) are discussed so that caveats and short-comings are understood. Reliability and assurance quantification may not always be possible, but determining where risks are taken and how to classify them is the essential topic for the intended practice: to establish radiation requirements with the goal of getting to mission success.

Campola, Michael J.↗
NASA NTRS2019

ISSI IS46DR16640B-25DBA25 DDR2 SDRAM Total Ionizing Dose Characterization Test Report

The purpose of this testing is to characterize the ISSI IS46DR16640B-25DBA25 parameter degradation for total dose response. This test’s purpose is to evaluate and compare lot date codes for sensitivity. In the test, the device is exposed to both low dose and high dose rate (HDR) irradiations using gamma radiation. Device parameters such as leakage currents, quantity of upset bits or addresses, and overall chip and die health are investigated to determine which lot is more robust. These parameters directly affect the functionality of the memory within a system and may determine thresholds necessary to mitigate failure.

Total Ionizing Dose (TID)↗
NASA NTRS2017

Failure Analysis of Heavy-Ion-Irradiated Schottky Diodes

In this work, we use high- and low-magnitude optical microscope images, infrared camera images, and scanning electron microscope images to identify and describe the failure locations in heavy-ion-irradiated Schottky diodes.

single-event effect (SEE)↗
NASA NTRS2017

An Improved SEL Test of the ADV212 Video Codec

Single-event effect (SEE) test data is presented on the Analog Devices ADV212. Focus is given to the test setup used to improve data quality and validate single-event latchup (SEL) protection circuitry.

Single-event effect (SEE); microelectronic devices↗
NASA NTRS2017

An Improved SEL Test of the ADV212 Video Codec

Single-event effect (SEE) test data is presented on the Analog Devices ADV212. Focus is given to the test setup used to improve data quality and validate single-event latch-up (SEL) protection circuitry.

Single-event effect (SEE); microelectronic devices↗
NASA NTRS2017

Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program

Total ionizing dose and displacement damage testing was performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices. Displacement Damage, Optoelectronics, Proton Damage, Single Event Effects, and Total Ionizing Dose.

Proton Damage↗
NASA NTRS2017

Destructive Single-Event Effects in Diodes

In this work, we discuss the observed single-event effects in a variety of types of diodes. In addition, we conduct failure analysis on several Schottky diodes that were heavy-ion irradiated. High- and low-magnitude optical microscope images, infrared camera images, and scanning electron microscope images are used to identify and describe the failure locations.

single event effects (SEE); Schottky diode; heavy ↗