NASA NTRS · 20060029341
A reliability evaluation methodology for memory chips for space applications when sample size is small
Abstract
This paper presents a reliability evaluation methodology to obtain the statistical reliability information of memory chips for space applications when the test sample size needs to be kept small because of the high cost of the radiation hardness memories.
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Chen, Y., Nguyen, D., Guertin, S., Berstein, J., White, M., Menke, R., Kayali, S.. 2003-10-20. A reliability evaluation methodology for memory chips for space applications when sample size is small. https://ntrs.nasa.gov/citations/20060029341
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