TY  - RPRT
TI  - A reliability evaluation methodology for memory chips for space applications when sample size is small
AU  - Chen, Y.
AU  - Nguyen, D.
AU  - Guertin, S.
AU  - Berstein, J.
AU  - White, M.
AU  - Menke, R.
AU  - Kayali, S.
PY  - 2003
UR  - https://ntrs.nasa.gov/citations/20060029341
ID  - 20060029341
ER  -