Engineering topics

Berstein, J.

Publications and source records attributed to Berstein, J..

2 records

NASA NTRS2003

A reliability evaluation methodology for memory chips for space applications when sample size is small

This paper presents a reliability evaluation methodology to obtain the statistical reliability information of memory chips for space applications when the test sample size needs to be kept small because of the high cost of the radiation hardness memories.

reliability memory↗

NASA NTRS1998

The Effects of Radiation on the Resonant Frequency of a Polysilicon Microstructure

A mechanical microstructure was exposed to 10 Mrad of Gamma Rays from Cobalt-60 source to examine the effects of possible lattice damage upon the Young's modulus of polysilicon.

Systems Sandia National Laboratories↗