NASA NTRS · 19890038404
Full temperature single event upset characterization of two microprocessor technologies
Abstract
Data for the 9450 I3L bipolar microprocessor and the 80C86 CMOS/epi (vintage 1985) microprocessor are presented, showing single-event soft errors for the full MIL-SPEC temperature range of -55 to 125 C. These data show for the first time that the soft-error cross sections continue to decrease with decreasing temperature at subzero temperatures. The temperature dependence of the two parts, however, is very different.
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Nichols, Donald K., Coss, James R., Smith, L. S., Rax, Bernard, Huebner, Mark. 1988-12-01. Full temperature single event upset characterization of two microprocessor technologies. https://ntrs.nasa.gov/citations/19890038404
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