@misc{indiciae8d97e65136a9,
  title = {Full temperature single event upset characterization of two microprocessor technologies},
  author = {Nichols, Donald K. and Coss, James R. and Smith, L. S. and Rax, Bernard and Huebner, Mark},
  year = {1988},
  url = {https://ntrs.nasa.gov/citations/19890038404},
  note = {Source identifier: 19890038404}
}