TY  - RPRT
TI  - Full temperature single event upset characterization of two microprocessor technologies
AU  - Nichols, Donald K.
AU  - Coss, James R.
AU  - Smith, L. S.
AU  - Rax, Bernard
AU  - Huebner, Mark
PY  - 1988
UR  - https://ntrs.nasa.gov/citations/19890038404
ID  - 19890038404
ER  -