Catastrophic degradation in GaAs laser diodes
GaAs laser diodes thermal degradation, observing nature, extent and occurrence of permanent damage
Shaw, D. A.↗
Engineering topics
Thornton, P. R.
Publications and source records attributed to Thornton, P. R..
Scanning electron microscopy in device diagnostics and reliability physics.
Scanning electron microscopy to study device failure and performance, discussing limitations and progress
Shaw, D. A.↗
The application of scanning electron microscopy to bulk devices. Part 1 - Gunn diodes
Feasibility study of scanning electron microscopy to diagnose properties of small Gunn diodes
Gopinath, A.↗
The application of the scanning electron microscope to studies of current multiplication, avalanche breakdown and thermal runaway. Part 1 - General physical basis
Scanning electron microscope applications in study of current multiplication, avalanche breakdown, and thermal runaway - Physical basis
Shaw, D. A.↗
The application of the scanning electron microscope to studies of current multiplication, avalanche breakdown and thermal runaway. Part 2 - General studies, mainly non-thermal
Scanning electron microscope applications in study of current multiplication, avalanche breakdown, and thermal runaway - Nonthermal effects in Read diodes
Sulway, D. V.↗
The application of the scanning electron microscope to studies of current multiplication, avalanche breakdown and thermal runaway. Part 3 - Thermal runaway in multi-emitter power transistors
Scanning electron microscopy applications in study of thermal runaway in multi-emitter power transistors
Sulway, D. V.↗
Device failure analysis by scanning electron microscopy
Scanning electron microscopy for semiconductor device failure analysis
Davies, I. G.↗