Catastrophic degradation in GaAs laser diodes
GaAs laser diodes thermal degradation, observing nature, extent and occurrence of permanent damage
Shaw, D. A.↗
Engineering topics
Shaw, D. A.
Publications and source records attributed to Shaw, D. A..
Scanning electron microscopy in device diagnostics and reliability physics.
Scanning electron microscopy to study device failure and performance, discussing limitations and progress
Shaw, D. A.↗
The application of channel electron multipliers to scanning electron microscopy Progress report
Channel electron multipliers for cathode luminescent collection of topographic details
Shaw, D. A.↗
The application of scanning electron microscopy to bulk devices. Part 1 - Gunn diodes
Feasibility study of scanning electron microscopy to diagnose properties of small Gunn diodes
Gopinath, A.↗
The further development of scanning electron microscopy in the microelectronics field semiannual report, 1 jan. - 30 jun. 1968
Explore the source record for details and available documents.
Shaw, D. A.↗
The application of the scanning electron microscope to studies of current multiplication, avalanche breakdown and thermal runaway. Part 1 - General physical basis
Scanning electron microscope applications in study of current multiplication, avalanche breakdown, and thermal runaway - Physical basis
Shaw, D. A.↗
Device failure analysis by scanning electron microscopy
Scanning electron microscopy for semiconductor device failure analysis
Davies, I. G.↗