Development of the Circuit Design from the Logic Design of a Random Walk Machine Final Report
Logic design of small, high speed, random walk machine for solving Laplace equation
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Logic design of small, high speed, random walk machine for solving Laplace equation
Procedure performs all work required for logic design of digital counters or sequential circuits and simplification of Boolean expressions. Program provides simple, accurate, and comprehensive logic design capability to users both experienced and totally inexperienced in logic design
This paper deals with the issue of designing microprocessor based systems with testability in mind. The ease of eventual testability should be a design consideration from the earliest design stage. Design guidelines with explicit examples for ease of testability are given. The issue of testing microprocessors as contrasted with testing random logic design is addressed, and procedures are delineated for the testability of microprocessors. Microprocessor testability design guidelines are discussed both at the design stage of the microprocessor itself as well as at the stage where the processor is imbedded as a component in a larger system. Specific instances and examples of a collection of design do's and don'ts are provided.
Logic design errors have been observed in space flight missions and the final stages of ground test. The technologies used by designers and their design/analysis methodologies will be analyzed. This will give insight to the root causes of the failures. These technologies include discrete integrated circuit based systems, systems based on field and mask programmable logic, and the use computer aided engineering (CAE) systems. State-of-the-art (SOTA) design tools and methodologies will be analyzed with respect to high-reliability spacecraft design and potential pitfalls are discussed. Case studies of faults from large expensive programs to "smaller, faster, cheaper" missions will be used to explore the fundamental reasons for logic design problems.
This manual presents a computer program that performs all the work required for the logic design of digital counters or sequential circuits and the simplification of Boolean logic expressions. The program provides both the experienced and inexperienced logic designer with a comprehensive logic design capability. The manual contains Boolean simplification and sequential design theory, detailed instructions for use of the program, a large number of illustrative design examples, and complete program documentation.
This presentation looks at logic design from early in the US Space Program, it examines faults in recent logic designs, and gives some examples from the analysis of new tools and techniques.
This paper presents a look at logic design from early in the US Space Program and examines faults in recent logic designs. Most examples are based on flight hardware failures and analysis of new tools and techniques. The paper is presented in viewgraph form.
Logical processing units and interconnection networks design noting reliability, fault diagnosis, computer coordination of data and control processes, etc
Fail-safe computing refers to computing systems that revert to a non-operational safe state when a fault occurs. In this paper, we investigate a circuit level technique as mitigation for single event upsets (SEUs) and fault injection attacks on field programmable gate arrays (FPGAs), and analyze the effectiveness of the technique as a fail-safe monitor for an encryption algorithm. The propagation of fault effects through FPGA primitives including lookup tables (LUTs) and programmable interconnect points (PIPs) is assessed within an FPGA architecture created using an open source tool, and validated using fault injection experiments on an FPGA. The analysis reveals additional vulnerabilities exist within reconfigurable architectures over those in equivalent fail-safe application specific integrated circuit (ASIC), thus requiring a more elaborate network of redundant circuits and checking logic. The configuration memory bits (CMBs), which configure routing and designate logic functions within the LUTs of the FPGA, add complexity to fail-safe design strategies by introducing additional fault conditions and fault propagation paths. A resource-efficient fail-safe circuit design technique called DEsign for Fail-safe in reCONfigurable systems (DEFCON) is proposed. The benefits and limitations associated with DEFCON are described in the context of fault injection experiments carried out as simulations and in FPGA hardware.
Quicklist, a preprocessor for an existing wire list program that cuts the description of the wire list by about 67 percent over previous methods, is described. Quicklist uses two different methods to shorten the input data. The first of these is the use of parentheses to allow a compact way of describing signal names which increment (or decrement) by one, i.e., typical signal names in a bus. The other method used is the equal sign. Using this symbol in a signal list says that the rest of the signals on that chip are the same as those on the previous chip described. Quicklist is intended to be the basis of a computer aided logic design system.
Digital computer components which perform two dimensional array logic operations (Tse logic) on binary data arrays are described. The properties of Golay transforms which make them useful in image processing are reviewed, and several architectures for Golay transform processors are presented with emphasis on the skeletonizing algorithm. Conventional logic control units developed for the Golay transform processors are described. One is a unique microprogrammable control unit that uses a microprocessor to control the Tse computer. The remaining control units are based on programmable logic arrays. Performance criteria are established and utilized to compare the various Golay transform machines developed. A critique of Tse logic is presented, and recommendations for additional research are included.
The PIP-II Machine Protection System (MPS) requires a dedicated set of tools for configuration control and management of the machine modes and beam modes of the accelerator. The protection system reacts to signals from various elements of the machine according to rules established in a setup database in the form of a Look-Up-Table filtered by the program Mode Controller. This is achieved in accordance with commands from the operator and governed by the firmware logic of the MPS. This paper describes the architecture, firmware logic, and implementation of the program mode controller.
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Recovery in a fault-tolerant computer means the continuation of system operation with data integrity after an error occurs. This paper delineates two parallel concepts embodied in the hardware and software functions required for recovery; detection, diagnosis, and reconfiguration for hardware, data integrity, checkpointing, and restart for the software. The hardware relies on the recovery variable set, checking circuits, and diagnostics, and the software relies on the recovery information set, audit, and reconstruct routines, to characterize the system state and assist in recovery when required. Of particular utility is a handware unit, the recovery control unit, which serves as an interface between error detection and software recovery programs in the supervisor and provides dynamic interactive recovery.
Abstract not provided.
A family of standardized thick-oxide P-MOS building blocks (standard cells) is described. The information is presented in a form useful for systems designs, logic design, and the preparation of inputs to both sets of Design Automation programs for array design and analysis. A data sheet is provided for each cell and gives the cell name, the cell number, its logic symbol, Boolean equation, truth table, circuit schematic circuit composite, input-output capacitances, and revision date. The circuit type file, also given for each cell, together with the logic drawing contained on the data sheet provides all the information required to prepare input data files for the Design Automation Systems. A detailed description of the electrical design procedure is included.
This report presents the success merits, logic design details, and test plans for adaptive protection schemes for microgrids, secondary distribution networks, and radial distribution feeders. Success merits are presented in terms of challenges and issues which should be mitigated. The challenges and issues were identified during site-specific simulations and analysis presented in a prior report. The adaptive protection logic designs are presented in a vendor-neutral manner to make them readily adaptable to site--specific protection relays and controllers which support custom logic design. Vendor-specific implementations of the logic for the adaptive protection laboratory tests are also presented. The final section of the report presents details of the testing methodology, plans, and documentation for each of the three adaptive protection schemes.