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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1999

COSS Lesson Creation Process

COSS (Crew On-Orbit System Support) is changing. Designed as computer based in-flight refresher training, it is getting good reviews and the demands on the product can be expected to increase. Last year, the lessons were written using Authorware, which had a number of limitations. The most important one was that the navigation and the layout functions were both in one package that was not easy to learn. The lesson creator had to be good at both programming and design. There were also a number of other problems, as detailed in my report last year. This year the COSS unit made the switch to embrace modularity. The navigation function is handled by a player that was custom-written using Delphi. The layout pages are now standard HTML files that can be created using any number of products. This new system gives new flexibility and unties the process from one product (and one company). The player can be re-written by a programmer without affecting the lesson pages. It is also now possible for anybody with a word-processor to make part of the HTML lesson pages and to use many of the new commercially available tools that are being designed for web pages. This summer I created a computer-based training (CBT) lesson on the IBM ThinkPad 760 ED and 760XD laptop computers that should fly on the International Space Station. I also examined the COSS system, the new player and the other new software products.

Harper, R. Stephen↗
NASA NTRS2004

Compact, Automated Centrifugal Slide-Staining System

The Directional Acceleration Vector-Driven Displacement of Fluids (DAVD-DOF) system, under development at the time of reporting the information for this article, would be a relatively compact, automated, centrifugally actuated system for staining blood smears and other microbiological samples on glass microscope slides in either a microgravitational or a normal Earth gravitational environment. The DAVD-DOF concept is a successor to the centrifuge-operated slide stainer (COSS) concept, which was reported in Slide-Staining System for Microgravity or Gravity (MSC-22949), NASA Tech Briefs, Vol. 25, No. 1 (January, 2001), page 64. The COSS includes reservoirs and a staining chamber that contains a microscope slide to which a biological sample is affixed. The staining chamber is sequentially filled with and drained of staining and related liquids from the reservoirs by use of a weighted plunger to force liquid from one reservoir to another at a constant level of hypergravity maintained in a standard swing-bucket centrifuge. In the DAVD-DOF system, a staining chamber containing a sample would also be sequentially filled and emptied, but with important differences. Instead of a simple microscope slide, one would use a special microscope slide on which would be fabricated a network of very small reservoirs and narrow channels connected to a staining chamber (see figure). Unlike in the COSS, displacement of liquid would be effected by use of the weight of the liquid itself, rather than the weight of a plunger.

Feeback, Daniel L.↗
NASA NTRS1976

EVA space suit Evaporative Cooling/Heating Glove System (ECHGS)

A new astronaut glove, the Evaporative Cooling/Heating Glove System (ECHGS), was designed and developed to allow the handling of objects between -200 F and +200 F. Active heating elements, positioned at each finger pad, provide additional heat to the finger pads from the rest of the finger. A water evaporative cooling system provides cooling by the injection of water to the finger areas and the subsequent direct evaporation to space. Thin, flexible insulation has been developed for the finger areas to limit thermal conductivity. Component and full glove tests have shown that the glove meets and exceeds the requirements to hold a 11/2 inch diameter bar at + or - 200 F for three minutes within comfort limits. The ECHGS is flexible, lightweight and comfortable. Tactility is reasonable and small objects can be identified especially by the fingertips beyond the one half width active elements.

Coss, F. A.↗
NASA NTRS1985

Total integrated dose testing of solid-state scientific CD4011, CD4013, and CD4060 devices by irradiation with CO-60 gamma rays

The total integrated dose response of three CMOS devices manufactured by Solid State Scientific has been measured using CO-60 gamma rays. Key parameter measurements were made and compared for each device type. The data show that the CD4011, CD4013, and CD4060 produced by this manufacturers should not be used in any environments where radiation levels might exceed 1,000 rad(Si).

Dantas, A. R. V.↗
NASA NTRS1985

Total-dose radiation effects data for semiconductor devices: 1985 supplement, volume 1

Steady-state, total-dose radiation test data are provided, in graphic format, for use by electronic designers and other personnel using semiconductor devices in a radiation environment. The data were generated by JPL for various NASA space programs. The document is in two volumes: Volume 1 provides data on diodes, bipolar transistors, field effect transistors, and miscellaneous semiconductor types, and Volume 2 provides total-dose radiation test data on integrated circuits. Volume 1 of this 1985 Supplement contains new total-dose radiation test data generated since the August 1, 1981 release date of the original Volume 1. Publication of Volume 2 of the 1985 Supplement will follow that of Volume 1 by approximately three months.

Martin, K. E.↗
NASA NTRS1986

Total-dose radiation effects data for semiconductor devices. 1985 supplement. Volume 2, part A

Steady-state, total-dose radiation test data, are provided in graphic format for use by electronic designers and other personnel using semiconductor devices in a radiation environment. The data were generated by JPL for various NASA space programs. This volume provides data on integrated circuits. The data are presented in graphic, tabular, and/or narrative format, depending on the complexity of the integrated circuit. Most tests were done using the JPL or Boeing electron accelerator (Dynamitron) which provides a steady-state 2.5 MeV electron beam. However, some radiation exposures were made with a Cobalt-60 gamma ray source, the results of which should be regarded as only an approximate measure of the radiation damage that would be incurred by an equivalent electron dose.

Martin, K. E.↗
NASA NTRS1986

Total-dose radiation effects data for semiconductor devices. 1985 Supplement. Volume 2, part B

Steady-state, total-dose radiation test data are provided in graphic format, for use by electronic designers and other personnel using semiconductor devices in a radiation environment. The data were generated by JPL for various NASA space programs. The document is in two volumes: Volume 1 provides data on diodes, bipolar transistors, field effect transistors, and miscellaneous semiconductor types, and Volume 2 (Parts A and B) provides data on integrated circuits. The data are presented in graphic, tabular, and/or narrative format, depending on the complexity of the integrated circuit. Most tests were done steady-state 2.5-MeV electron beam. However, some radiation exposures were made with a Cobalt-60 gamma ray source, the results of which should be regarded as only an approximate measure of the radiation damage that would be incurred by an equivalent electron dose. All data were generated in support of NASA space programs by the JPL Radiation Effects and Testing Group (514).

Martin, K. E.↗
NASA NTRS1987

Single event upset (SEU) testing at JPL

It is believed that the increase in SEUs with more modern devices may have serious consequences for future space missions. The physics behind an SEU is discussed as well as SEU test philosophy and equipment, and testing results. It is concluded that the problem may be ameliorated by careful device selection and the use of redundancy or error correction.

Coss, James R.↗
NASA NTRS1988

Models of second-order effects in metal-oxide-semiconductor field-effect transistors for computer applications

Second-order effects in metal-oxide-semiconductor field-effect transistors (MOSFETs) are important for devices with dimensions of 2 microns or less. The short and narrow channel effects and drain-induced barrier lowering primarily affect threshold voltage, but formulas for drain current must also take these effects into account. In addition, the drain current is sensitive to channel length modulation due to pinch-off or velocity saturation and is diminished by electron mobility degradation due to normal and lateral electric fields in the channel. A model of a MOSFET including these considerations and emphasizing charge conservation is discussed.

Benumof, Reuben↗
NASA NTRS1988

Heavy ion induced Single Event Phenomena (SEP) data for semiconductor devices from engineering testing

The accumulation of JPL data on Single Event Phenomena (SEP), from 1979 to August 1986, is presented in full report format. It is expected that every two years a supplement report will be issued for the follow-on period. This data for 135 devices expands on the abbreviated test data presented as part of Refs. (1) and (3) by including figures of Single Event Upset (SEU) cross sections as a function of beam Linear Energy Transfer (LET) when available. It also includes some of the data complied in the JPL computer in RADATA and the SPACERAD data bank. This volume encompasses bipolar and MOS (CMOS and MHNOS) device data as two broad categories for both upsets (bit-flips) and latchup. It also includes comments on less well known phenomena, such as transient upsets and permanent damage modes.

Nichols, Donald K.↗
NASA NTRS1988

Full temperature single event upset characterization of two microprocessor technologies

Data for the 9450 I3L bipolar microprocessor and the 80C86 CMOS/epi (vintage 1985) microprocessor are presented, showing single-event soft errors for the full MIL-SPEC temperature range of -55 to 125 C. These data show for the first time that the soft-error cross sections continue to decrease with decreasing temperature at subzero temperatures. The temperature dependence of the two parts, however, is very different.

Nichols, Donald K.↗
NASA NTRS1988

Differential color brightness as a body orientation cue

Ninety male and female college students reclining on their backs in the dark were disoriented when positioned on a rotating platform under a slowly rotating disk that filled their entire visual field. Half of the disk was painted with a brighter value (about 69 percent higher luminance level) of the color on the other half. The effects of red, blue, and yellow were examined. Subjects wearing frosted goggles viewed the illuminated disk for three rotations. The disk was stopped when the subjects felt that they were right side up. A significant proportion of subjects selected the disk position in which the brighter side of each of the three colors filled their upper visual field. These results suggest that color brightness as well as lighting variation could provide Space Station crew members with body orientation cues as they move around.

Barbour, Christopher G.↗
NASA NTRS1990

Calculating Second-Order Effects in MOSFET's

Collection of mathematical models includes second-order effects in n-channel, enhancement-mode, metal-oxide-semiconductor field-effect transistors (MOSFET's). When dimensions of circuit elements relatively large, effects neglected safely. However, as very-large-scale integration of microelectronic circuits leads to MOSFET's shorter or narrower than 2 micrometer, effects become significant in design and operation. Such computer programs as widely-used "Simulation Program With Integrated Circuit Emphasis, Version 2" (SPICE 2) include many of these effects. In second-order models of n-channel, enhancement-mode MOSFET, first-order gate-depletion region diminished by triangular-cross-section deletions on end and augmented by circular-wedge-cross-section bulges on sides.

Benumof, Reuben↗
NASA NTRS1990

Effects Of Dose Rates On Radiation Damage In CMOS Parts

Report describes measurements of effects of ionizing-radiation dose rate on consequent damage to complementary metal oxide/semiconductor (CMOS) electronic devices. Depending on irradiation time and degree of annealing, survivability of devices in outer space, or after explosion of nuclear weapons, enhanced. Annealing involving recovery beyond pre-irradiation conditions (rebound) detrimental. Damage more severe at lower dose rates.

Goben, Charles A.↗
NASA NTRS1990

Temperature Dependence Of Single-Event Effects

Report describes experimental study of effects of temperature on vulnerability of integrated-circuit memories and other electronic logic devices to single-event effects - spurious bit flips or latch-up in logic state caused by impacts of energetic ions. Involved analysis of data on 14 different device types. In most cases examined, vulnerability to these effects increased or remain constant with temperature.

Coss, James R.↗
NASA NTRS1989

Functional decor in the International Space Station: Body orientation cues and picture perception

Subjective reports of American astronauts and their Soviet counterparts suggest that homogeneous, often symmetrical, spacecraft interiors can contribute to motion sickness during the earliest phase of a mission and can also engender boredom. Two studies investigated the functional aspects of Space Station interior aesthetics. One experiment examined differential color brightnesses as body orientation cues; the other involved a large survey of photographs and paintings that might enhance the interior aesthetics of the proposed International Space Station. Ninety male and female college students reclining on their backs in the dark were disoriented by a rotating platform and inserted under a slowly rotating disk that filled their entire visual field. The entire disk was painted the same color but one half had a brightness value that was about 69 percent higher than the other. The effects of red, blue, and yellow were examined. Subjects wearing frosted goggles opened their eyes to view the rotating, illuminated disk, which was stopped when they felt that they were right-side up. For all three colors, significant numbers of subjects said they felt right-side up when the brighter side of the disk filled their upper visual field. These results suggest that color brightness could provide Space Station crew members with body orientation cues as they move about. It was found that subjects preferred photographs and paintings with the greatest depths of field, irrespective of picture topic.

Coss, Richard G.↗
NASA NTRS1990

Total-dose radiation effects data for semiconductor devices (1989 supplement)

Steady state, total dose radiation test data are provided for electronic designers and other personnel using semiconductor devices in a radiation environment. The data are presented in graphic and narrative formats. Two primary radiation source types were used: Cobalt-60 gamma rays and a Dynamitron electron accelerator capable of delivering 2.5 MeV electrons at a steady rate.

Martin, Keith E.↗
NASA NTRS1991

The NASA Microelectronics Space Radiation Effects Program (MSREP) at the Jet Propulsion Laboratory

The primary objective of the Microelectronics Space Radiation Effects Program (MSREP) at the Jet Propulsion Laboratory (JPL) is to assist NASA in the selection of radiation hardened microelectronic parts for insertion in NASA space systems through radiation testing and research. Prior to presenting examples of the research and testing on Single Event Effects (SEE) and Total Ionizing Dose (TID) effects, the space radiation environment and radiation requirements for the CRAFT/Cassini program, a typical JPL space project, are discussed.

Barnes, C.↗