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We present results and analysis investigating the effects of radiation on a variety of candidate spacecraft electronics to heavy ion and proton induced single event effects (SEE), proton-induced displacement damage dose (DDD), and total ionizing dose (TID).
We present results and analysis investigating the effects of radiation on a variety of candidate spacecraft electronics to heavy ion and proton induced single-event effects (SEE), proton-induced displacement damage dose (DDD), and total ionizing dose (TID).
We present results and analysis investigating the effects of radiation on a variety of candidate spacecraft electronics to heavy ion and proton induced single-event effects (SEE), proton-induced displacement damage dose (DDD), and total ionizing dose (TID).
Part 1 is to present the results of tests on 56 types of core in a form convenient for use in the study of the performance of and possible improvements in existing designs. Working rules are given by which the data contained in the report may be used, and the most obvious conclusions as to the behavior of cores are summarized. Part 2 presents the results of tests made to determine the pressure necessary to produce water flows up to 50 gallons per minute through an 8-inch square section of radiator core. These data are of special value in evaluating the hydraulic head against which the circulating pump is required to operate.
Two areas of radiation hardened microcircuit infrastructure will be discussed: 1) The availability and performance of radiation hardened microcircuits, and, and 2) The access to radiation test facilities primarily for proton single event effects (SEE) testing. Other areas not discussed, but are a concern include: The challenge for maintaining radiation effects tool access for assurance purposes, and, the access to radiation test facilities primarily for heavy ion single event effects (SEE) testing. Status and implications will be discussed for each area.
Three read/write random access memories, AM91L24, HM1-6514, and MWS 5114, were subjected to total dose irradiation at three dose rates, with electrical testing after each increment of dosage. Annealing measurements were performed after the radiation tests were completed. The AM91L24 showed a strong dose rate effect and substantial post-irradiation annealing of radiation-induced damage. The dose rate effect was that a lower dose rate produced less net damage than an eqivalent total dose applied at a higher rate. The HM1-6514 showed essentially no dose rate effect and no annealing damage, and the MWS 5114 exhibited a moderate effect with some annealing. It was concluded that dose rate is an important parameter in radiation test procedures for MOS microcircuits and that annealing measurements may be important evaluation aids for such tests.
The SuperSonic Transport (SST) development program within the US was based at the Langley Research Center as was the Apollo radiation testing facility (Space Radiation Effects Laboratory) with associated radiation research groups. It was natural for the issues of the SST to be first recognized by this unique combination of research programs. With a re-examination of the technologies for commercial supersonic flight and the possible development of a High Speed Civil Transport (HSCT), the remaining issues of the SST required resolution. It was the progress of SST radiation exposure research program founded by T. Foelsche at the Langley Research Center and the identified remaining issues after that project over twenty-five years ago which became the launch point of the current atmospheric ionizing radiation (AIR) research project. Added emphasis to the need for reassessment of atmospheric radiation resulted from the major lowering of the recommended occupational exposure limits, the inclusion of aircrew as radiation workers, and the recognition of civil aircrew as a major source of occupational exposures. Furthermore, the work of Ferenc Hajnal of the Environmental Measurements Laboratory brought greater focus to the uncertainties in the neutron flux at high altitudes. A re-examination of the issues involved was committed at the Langley Research Center and by the National Council on Radiation Protection (NCRP). As a result of the NCRP review, a new flight package was assembled and flown during solar minimum at which time the galactic cosmic radiation is at a maximum (June 1997). The present workshop is the initial analysis of the new data from that flight. The present paper is an overview of the status of knowledge of atmospheric ionizing radiations. We will re-examine the exposures of the world population and examine the context of aircrew exposures with implications for the results of the present research. A condensed version of this report was given at the 1998 Annual Meeting of the NCRP with proceedings published in the journal of Health Physics.
Certifying electronic components is a very involved process. It includes pre-coordination with the radiation test facility for time, schedule and cost, as well as intimate work with designers to develop test procedures and hardware. It also involves work with radiation engineers to understand the effects of the radiation field on the test article/setup as well as the analysis and production of a test report. The technical content of traditional ionizing radiation testing protocol is in wide use and generally follows established standards (ref. Appendix C). This document is not intended to cover all these areas but to cover the methodology of using Variable Depth Bragg Peak (VDBP) to accomplish the goal of characterizing an electronic component. The Variable Depth Bragg Peak (VDBP) test method is primarily used for deep space applications of electronics. However, it can be used on any part for any radiation environment, especially those parts where the sensitive volume cannot be reached by the radiation beam. An example of this problem would be issues that arise in de-lidding of parts or in parts with flip-chip designs, etc. The VDBP method is ideally suited to test modern avionics designs which increasingly incorporate commercial off-the-shelf (COTS) parts and units. Johnson Space Center (JSC) developed software provides assistance to users in developing the radiation characterization data from the raw test data.
This report focuses on the limited environmental testing of the AMOLED display performed as an engineering evaluation by The NASA Johnson Space Center (JSC)-specifically. EMI. Thermal Vac, and radiation tests. The AMOLED display is an active-matrix Organic Light Emitting Diode (OLED) technology. The testing provided an initial understanding of the technology and its suitability for space applications. Relative to light emitting diode (LED) displays or liquid crystal displays (LCDs), AMOLED displays provide a superior viewing experience even though they are much lighter and smaller, produce higher contrast ratio and richer colors, and require less power to operate than LCDs. However, AMOLED technology has not been demonstrated in a space environment. Therefore, some risks with the technology must be addressed before they can be seriously considered for human spaceflight. The environmental tests provided preliminary performance data on the ability of the display technology to handle some of the simulated induced space/spacecraft environments that an AMOLED display will see during a spacecraft certification test program. This engineering evaluation is part of a Space Act Agreement (SM) between The NASA/JSC and Honeywell International (HI) as a collaborative effort to evaluate the potential use of AMOLED technology for future human spaceflight missions- both government-led and commercial. Under this SM, HI is responsible for doing optical performance evaluation, as well as temperature and touch screen studies. The NASA/JSC is responsible for performing environmental testing comprised of EMI, Thermal Vac, and radiation tests. Additionally, as part of the testing, limited optical data was acquired to assess performance as the display was subjected to the induced environments. The NASA will benefit from this engineering evaluation by understanding AMOLED suitability for future use in space as well as becoming a smarter buyer (or developer) of the technology. HI benefits from the environmental testing results by understanding its performance limitations/shortcomings to improve subsequent generations of AMOLED technology. Note that the AMOLED used in this test was not deSigned for the space environment but rather for commercial/industrial terrestrial applications.
This report focuses on the limited environmental testing of the AMOLED display performed as an engineering evaluation by The NASA Johnson Space Center (JSC)-specifically. EMI. Thermal Vac, and radiation tests. The AMOLED display is an active-matrix Organic Light Emitting Diode (OLED) technology. The testing provided an initial understanding of the technology and its suitability for space applications. Relative to light emitting diode (LED) displays or liquid crystal displays (LCDs), AMOLED displays provide a superior viewing experience even though they are much lighter and smaller, produce higher contrast ratio and richer colors, and require less power to operate than LCDs. However, AMOLED technology has not been demonstrated in a space environment. Therefore, some risks with the technology must be addressed before they can be seriously considered for human spaceflight. The environmental tests provided preliminary performance data on the ability of the display technology to handle some of the simulated induced space/spacecraft environments that an AMOLED display will see during a spacecraft certification test program. This engineering evaluation is part of a Space Act Agreement (SM) between The NASA/JSC and Honeywell International (HI) as a collaborative effort to evaluate the potential use of AMOLED technology for future human spaceflight missions- both government-led and commercial. Under this SM, HI is responsible for doing optical performance evaluation, as well as temperature and touch screen studies. The NASA/JSC is responsible for performing environmental testing comprised of EMI, Thermal Vac, and radiation tests. Additionally, as part of the testing, limited optical data was acquired to assess performance as the display was subjected to the induced environments. The NASA will benefit from this engineering evaluation by understanding AMOLED suitability for future use in space as well as becoming a smarter buyer (or developer) of the technology. HI benefits from the environmental testing results by understanding its performance limitations/shortcomings to improve subsequent generations of AMOLED technology. Note that the AMOLED used in this test was not deSigned for the space environment but rather for commercial/industrial terrestrial applications.
For electromagnetic immunity testing of an electronic system, it is desirable to demonstrate its functional integrity when exposed to the full range and intensity of environmental electromagnetic threats that may be encountered over its operational life. As part of this, it is necessary to show proper system operation when exposed to representative threat signal modulations. Modulated signal transition time is easily overlooked, but can be highly significant to system susceptibility. Radiated electromagnetic field immunity testing is increasingly being performed in Mode Stirred Chambers. Because the peak field vs. time relationship is affected by the operation of a reverberating room, it is important to understand how the room may influence any input signal modulation characteristics. This paper will provide insight into the field intensity vs. time relationship within the test environment of a mode stirred chamber. An understanding of this relationship is important to EMC engineers in determining what input signal modulation characteristics will be transferred to the equipment under test. References will be given for the development of this topic, and experimental data will be presented
This viewgraph presentation gives an overview of NASA Electronic Parts and Packaging (NEPP) Program's new electronics technology trends. The topics include: 1) The Changing World of Radiation Testing of Memories; 2) Even Application-Specific Tests are Costly!; 3) Hypothetical New Technology Part Qualification Cost; 4) Where we are; 5) Approaching FPGAs as a More Than a "Part" for Reliability; 6) FPGAs Beget Novel Radiation Test Setups; 7) Understanding the Complex Radiation Data; 8) Tracking Packaging Complexity and Reliability for FPGAs; 9) Devices Supporting the FPGA Need to be Considered; 10) Summary of the New Electronic Technologies and Insertion into Flight Programs Workshop; and 11) Highlights of Panel Notes and Comments
Ongoing qualification activities of LiNbO3 modulators. Passive (unpumped) radiation testing of Er-, Yb-, and Er/Yb-doped fibers: a) Yb-doped fibers exhibit higher radiation resistance than Er-doped fibers; b) Er/Yb co-doped fibers exhibit largest radiation resistance. Active (pumped) radiation testing of Yb-doped fibers conducted at NASA GSFC: a) Typical decay behavior observed; b) No comparison could be made to other fibers due to problems with test setup. Development of new high power fiber terminations.
Custom-made single-chip complementary metal-oxide semiconductor (CMOS) integrated circuit designed to reveal effects of ionizing radiation on itself and similar integrated circuits. Potential terrestrial use: safety-oriented monitoring of ionizing radiation at nuclear powerplants, nuclear-waste sites, and the like.
Liquid metal radiator and condenser test facility
During testing of a subscale radiator section used to develop manufacturing techniques for a full-scale radiator panel, the adhesive bonds between the titanium heat pipes and the aluminum face sheets failed during installation and operation. Analysis revealed that the thermal expansion mismatch between the two metals resulted in relatively large shear stresses being developed even when operating the radiator at moderate temperatures. Lap shear testing of the adhesive used in the original joints demonstrated that the two-part epoxy adhesive fell far short of the strength required. A literature review resulted in several candidate adhesives being selected for lap shear joint testing at room temperature and 398 K, the nominal radiator operating temperature. The results showed that two-part epoxies cured at room and elevated temperatures generally did not perform well. Epoxy film adhesives cured at elevated temperatures, on the other hand, did very well with most being sufficiently strong to cause yielding in the titanium sheet used for the joints. The use of an epoxy primer generally improved the strength of the joint. Based upon these results, a new adhesive was selected for the second subscale radiator section.
The MESSENGER (Mercury Surface, Space Environment, Geochemistry, and Ranging) spacecraft, planned for launch in March 2004, will perform two flybys of Mercury before entering a year-long orbit of the planet in September 2009. The mission will provide opportunities for detailed characterization of the surface, interior, atmosphere, and magnetosphere of the closest planet to the Sun. The NASA Glenn Research Center and the MESSENGER spacecraft integrator, the Johns Hopkins University Applied Physics Laboratory, have partnered under a Space Act Agreement to characterize a variety of critical components and materials under simulated conditions expected near Mercury. Glenn's Vacuum Facility 6, which is equipped with a solar simulator, can simulate the vacuum and high solar radiation anticipated in Mercury orbit. The MESSENGER test hardware includes a variety of materials and components that are being characterized during the Tank 6 vacuum tests, where the hardware will be exposed to up to 11 suns insolation, simulating conditions expected in Mercury orbit. In 2002, ten solar vacuum tests were conducted, including beginning of life, end of life, backside exposure, and solar panel thermal shock cycling tests. Components tested include candidate solar array panels, sensors, thermal shielding materials, and communication devices. As an example, for the solar panel thermal shock cycling test, two candidate solar array panels were suspended on a lift mechanism that lowered the panels into a liquid-nitrogen-cooled box. After reaching -140 C, the panels were then lifted out of the box and exposed to the equivalent of 6 suns (8.1 kilowatts per square meters). After five cold soak/heating cycles were completed successfully, there was no apparent degradation in panel performance. An anticipated 100-hr thermal shield life test is planned for autumn, followed by solar panel flight qualification tests in winter. Glenn's ongoing support to the MESSENGER program has been instrumental in identifying design solutions and validating thermal performance models under a very aggressive development schedule. The test data have assisted Johns Hopkins engineers in selecting a flight solar array vendor and a thermal shield design. MESSENGER is one in a series of missions in NASA's Discovery Program. Infrared thermography provides data on the thermal gradients in the MESSENGER components during high solar insolation vacuum testing.
Plans on the drawing board for future space missions call for much larger power systems than have been flown in the past. These systems would employ much higher voltages and currents to enable more powerful electric propulsion engines and other improvements on what will also be much larger spacecraft. Long term human outposts on the moon and planets would also require high voltage, high current and long life power sources. Only hundreds of watts are produced and controlled on a typical robotic exploration spacecraft today. Megawatt systems are required for tomorrow. Semiconductor devices used to control and convert electrical energy in large space power systems will be exposed to electromagnetic and particle radiation of many types, depending on the trajectory and duration of the mission and on the power source. It is necessary to understand the often very different effects of the radiations on the control and conversion systems. Power semiconductor test strategies that we have developed and employed will be presented, along with selected results. The early results that we have obtained in testing large power semiconductor devices give a good indication of the degradation in electrical performance that can be expected in response to a given dose. We are also able to highlight differences in radiation hardness that may be device or material specific.