NASA NTRS · 19930000544
Microelectronic Chips For Radiation-Dose Tests
Abstract
Custom-made single-chip complementary metal-oxide semiconductor (CMOS) integrated circuit designed to reveal effects of ionizing radiation on itself and similar integrated circuits. Potential terrestrial use: safety-oriented monitoring of ionizing radiation at nuclear powerplants, nuclear-waste sites, and the like.
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Buehler, Martin G., Lin, Yu-Sang, Ray, Kevin P., Sokoloski, Martin M.. 1993-09-01. Microelectronic Chips For Radiation-Dose Tests. https://ntrs.nasa.gov/citations/19930000544
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