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At least 127 records · Page 7
All sourcesNASA NTRSDOE OSTI
NASA NTRS1982

Electron loss study of the native oxide of tin

Using electron loss spectroscopy in combination with ion beam depth profiling, it has been established that the oxide of tin formed by electropolishing followed by room temperature aging is metal free and composed of a mixture of SnO2 and SnO. In a fresh oxide layer, the SnO2 is confined to the outer portion of the predominantly SnO oxide. In an aged oxide layer, SnO2 is present up to the oxide/metal interface with an ever decreasing concentration as the interface is approached.

Bevolo, A. J.↗
NASA NTRS1982

Xenon diffusion following ion implantation into feldspar - Dependence on implantation dose

The diffusion properties of xenon implanted into feldspar, a major mineral in meteorites and lunar samples, are investigated in light of the importance of xenon diffusion in the interpretation of early solar system chronologies and the retention time of solar-wind-implanted Xe. Known doses of Xe ions were implanted at an energy of 200 keV into single-crystal plagioclase targets, and depth profiles were measured by alpha particle backscattering before and after annealing for one hour at 900 or 1000 C. The fraction of Xe retained following annealing is found to be strongly dependent on implantation dose, being greatest at a dose of 3 x 10 to the 15th ions/sq cm and decreasing at higher and lower doses. Xe retention is also observed to be unaffected by two-step anneals, or by implantation with He or Ar. Three models of the dose-dependent diffusion properties are considered, including epitaxial crystal regrowth during annealing controlled by the extent of radiation damage, the creation of trapping sites by radiation damage, and the inhibition of recrystallization by Xe during annealing

Melcher, C. L.↗
NASA NTRS1982

Retention of ion-implanted-xenon in olivine: Dependence on implantation dose

The diffusion of Xe in olivine, a major mineral in both meteorites and lunar samples, was studied. Xe ions were implanted at 200 keV into single-crystal synthetic-forsterite targets and the depth profiles were measured by alpha particle backscattering before and after annealing for 1 hour at temperatures up to 1500 C. The fraction of implanted Xe retained following annealing was strongly dependent on the implantation dose. Maximum retention of 100% occurred for an implantion dose of 3 x 10 to the 15th power Xe ions/sq cm. Retention was less at lower doses, with (approximately more than or = 50% loss at one hundred trillion Xe ions/sq cm. Taking the diffusion coefficient at this dose as a lower limit, the minimum activation energy necessary for Xe retention in a 10 micrometer layer for ten million years was calculated as a function of metamorphic temperature.

Melcher, C. L.↗
NASA NTRS1983

Mechanism of lubrication by tricresylphosphate (TCP)

A pin-on-disk tribometer equipped with an induction heater was used to study the coefficient of friction as a function of temperature for tricresylphosphate (TCP) on continuous vacuum melted (CVM) M-50 tool steel when the TCP was present in a liquid reservoir (bulk lubrication), and when it was applied as a liquid layer directly to the disk (limited lubrication). Under limited lubrication conditions, experiments were performed in dry ( 100 ppm H2O) air, dry ( 20 ppm H2O) nitrogen, dry nitrogen with the disks heated to 700 C then cooled to room temperature before the TCP was applied and the measurements made (preheated disks), and moist nitrogen using preheated disks. When the coefficient of friction was plotted as a function of the disk temperature, the friction decreased at a characteristic temperature, T sub r whose observed values were 265 C for bulk lubrication conditions in dry air, 225 C for limited lubrication conditions in dry air, and 215 C for limited lubrication conditions in dry nitrogen. No decrease in friction was observed with preheated disks; instead a sharp failure temperature was observed at 218 C, which was taken as the temperature about which the behavior of TCP should be judged, X-ray photoelectron spectroscopy confirmed the presence of phosphate on the surface of the iron pins used in the tribometer under TCP lubrication. Depth profile studies support the idea that a chemical reaction occurs between the TCP and the metal surface at T sub r.

Faut, O. D.↗
NASA NTRS1983

Application of modern surface analytical tools in the investigation of surface deterioration processes

Surface profilometry and scanning electron microscopy were utilized to study changes in the surface of polymers when eroded. The X-ray photoelectron spectroscopy (XPS) and depth profile analysis indicate the corrosion of metal and ceramic surfaces and reveal the diffusion of certain species into the surface to produce a change in mechanical properties. Ion implantation, nitriding and plating and their effects on the surface are characterized. Auger spectroscopy analysis identified morphological properties of coatings applied to surfaces by sputter deposition.

Buckley, D. H.↗
NASA NTRS1982

Radiation-induced defects in SiO2 as determined with XPS

An analytical method based on oxide/substrate intensity ratios is used to deduce the product of the atomic number density and electron mean free path as a function of depth, for the cases of device-quality gate oxides grown on Si substrates and irradiated with zero to 20 eV electrons during in situ X-ray photoelectron spectroscopy. These structures had been thinned stepwise to 25-60 A by means of a wet chemical depth-profiling procedure. Si(3+) species are formed in the Si/SiO2 interface region, and their observation during their relaxation and annihilation is correlated with strained Si-O-Si bonds. The observation of bond of cleavage and bond strain gradients in these samples is used to extend silica devitrification models for the explanation of fixed oxide charge generation and interface states.

Grunthaner, F. J.↗
NASA NTRS1983

AES study on the chemical composition of ferroelectric BaTiO3 thin films RF sputter-deposited on silicon

AES depth profiling data are presented for thin films of BaTiO3 deposited on silicon by RF sputtering. By profiling the sputtered BaTiO3/silicon structures, it was possible to study the chemical composition and the interface characteristics of thin films deposited on silicon at different substrate temperatures. All the films showed that external surface layers were present, up to a few tens of angstroms thick, the chemical composition of which differed from that of the main layer. The main layer had stable composition, whereas the intermediate film-substrate interface consisted of reduced TiO(2-x) oxides. The thickness of this intermediate layer was a function of substrate temperature. All the films showed an excess of barium at the interface. These results are important in the context of ferroelectric phenomena observed in BaTiO3 thin films.

Dharmadhikari, V. S.↗
NASA NTRS1984

Effect of alloy chemistry and exposure conditions on the oxidation of titanium

Multiwall is a new thermal protection system concept for advanced space transportation vehicles. The system consists of discrete panels made up of multiple layers of foil gage metal. Titanium is the proposed candidate metal for multiwall panels in the reentry temperature range up to 675 C. Oxidation and embrittlement are the principal concerns related to the use of Ti in heat shield applications. The results of a broad study on the oxidation kinetics of several titanium alloys subjected to different exposure conditions are described. The alloys include commercially pure titanium, Ti-6Al-4V, and Ti-6Al-2Sn-4Zr-2Mo. Oxidation studies were performed on these alloys exposed at 704 C in 5-760 torr air pressure and 0 to 50% relative humidity. The resulting weight gains were correlated with oxide thickness and substrate contamination. The contamination depth and weight gains due to solid solutioning were obtained from microhardness depth profiles and hardness versus weight percent oxygen calibration data.

Unnam, J.↗
NASA NTRS1983

Retention of ion-implemented-xenon in olivine - Dependence on implantation dose

The diffusion of Xe in olivine, a major mineral in both meteorites and linear samples, was studied. Xe ions were implanted at 200 keV into single-crystal synthetic-forsterite targets and the depth profiles were measured by alpha particle backscattering before and after annealing for 1 hour at temperatures up to 1500 C. The fraction of implanted XE retained following annealing was strongly dependent on the implantation dose. Maximum retention of 100 percent occurred for an implanting dose of 3 x 10 to the 15th power Xe ions/sq cm. Retention was less at lower doses, with approximately more than or = 50 percent loss at one hundred trillion Xe ions/sq cm. Taking the diffusion coefficient at this dose as a lower limit, the minimum activation energy necessary for Xe retention in a 10 micrometer layer for ten million years was calculated as a function of metamorphic temperature. Previously announced in STAR as N83-18528

Melcher, C. L.↗
NASA NTRS1984

X-ray photoelectron spectroscopy study of the chemical structure of thermally nitrided SiO2

X-ray photoelectron spectroscopy has been used to study the composition of 100-A thermally grown SiO2 films that have been thermally nitrided in ammonia. The SiO(x)N(y)/Si interface was studied both by chemical depth profiling of the oxynitride and by removal of the Si substrate with XeF2. It is found that N is distributed throughout the film, but with the concentration higher at the surface and in a region centered 25 A from the film/substrate interface. The interface region itself is found to be oxygen-rich relative to the rest of the film. Possible models which can explain these results are discussed.

Vasquez, R. P.↗
NASA NTRS1984

An X-ray diffraction study of titanium oxidation

Titanium specimens of commercial purity were exposed at 1100 to 1400 F to laboratory air for times up to 100 hours. The extent of substrate contamination by interstitial oxygen was was determined by a new X-ray diffraction analysis involving transformation of X-ray diffraction intensity bands. The oxygen solid-solubility at the oxide-metal interfaces and its variation with time at temperature were also determined. Diffusion coefficients are deduced from the oxygen depth profiles.

Wiedemann, K. E.↗
NASA NTRS1985

Compatibility of grain-stabilized platinum with candidate propellants for resistojets

Resistojets are candidates for space station auxiliary propulsion, and should be characterized by both long life and multipropellant operations, requirements limited by available materials. Grain stabilized platinum is examined for use as a resistojet thruster material. Use of platinum in other applications indicates it can be used at moderately high temperatures for extended periods of time. Past results indicate that grain-stabilized platinum should be sufficiently inert in candidate propellant environments. Therefore, compatibility of platinum-yttria (P/Y2O3) and platinum-zirconia (Pt/ZrO2) with carbon dioxide, methane, hydrogen and ammonia is examined. A series of 1000 hr tests in CO2, H2, and NH3 is conducted at 1400 C and a series of 1000 hr tests in CH4 is conducted at about 500 C. Scanning electron microscopy, Auger electron spectroscopy and depth profiling analysis are then used to determine the effects of propellants on the material surface, to evaluate possible material contamination and to evaluate grain growth. The results indicate that there is carbon deposition on the surface of the Pt/Y2O3 and Pt/ZrO2 in both the CO2 and CH4 environments. In the H2 environment, the Pt/Y2O3 and Pt/ZrO2 specimen surfaces are roughened. After exposure to the NH3 environment, the Pt/Y2O3 and Pt/ZrO2 are roughened and pitted over the entire heated area with some pitted areas along the grain boundaries. SEM photos show grain growth in cross-sectional views of all the Pt/Y2O3 samples and the Pt/ZrO2 samples, except that tested in methane. Mass loss measurements indicate that Pt/Y2O3 and Pt/ZrO2 would last in excess of 200,000 hr in each propellant environment. However, in NH3 both Pt/Y2O3 and Pt/ZrO2 are severely pitted, with voids up to 50 percent into the material. Pt/Y2O3 and Pt/ZrO2 are not recommended for high temperature service in NH3.

Whalen, M. V.↗
NASA NTRS1985

Thermal stress cycling of GaAs solar cells

A thermal cycling experiment was performed on GaAs solar cells to establish the electrical and structural integrity of these cells under the temperature conditions of a simulated low-Earth orbit of 3-year duration. Thirty single junction GaAs cells were obtained and tests were performed to establish the beginning-of-life characteristics of these cells. The tests consisted of cell I-V power output curves, from which were obtained short-circuit current, open circuit voltage, fill factor, and cell efficiency, and optical micrographs, spectral response, and ion microprobe mass analysis (IMMA) depth profiles on both the front surfaces and the front metallic contacts of the cells. Following 5,000 thermal cycles, the performance of the cells was reexamined in addition to any factors which might contribute to performance degradation. It is established that, after 5,000 thermal cycles, the cells retain their power output with no loss of structural integrity or change in physical appearance.

Janousek, B. K.↗
NASA NTRS1986

Production of radionuclides in artificial meteorites irradiated isotropically with 600 MeV protons

The understanding of the production of cosmogenic nuclides in small meteorites (R is less than 40 cm) still is not satisfactory. The existing models for the calculation of depth dependent production rates do not distinguish between the different types of nucleons reacting in a meteorite. They rather use general depth dependent particle fluxes to which cross sections have to be adjusted to fit the measured radionuclide concentrations. Some of these models can not even be extended to zero meteorite sizes without logical contradictions. Therefore, a series of three thick target irradiations was started at the 600 MeV proton beam of the CERN isochronuous cyclotron in order to study the interactions of small stony meteorites with galactic protons. The homogeneous 4 pi irradiation technique used provides a realistic meteorite model which allows a direct comparison of the measured depth profiles with those in real meteorites. Moreover, by the simultaneous measurement of thin target production cross sections one can differentiate between the contributions of primary and secondary nucleons over the entire volume of the artificial meteorite.

Michel, R.↗
NASA NTRS1986

Studies on cosmogenic nuclides in meteorites with regard to an application as potential depth indicators

Measurements of stable and radioactive spallation products in meteorites allow to investigate their histories, especially with respect to the exposure to galactic cosmic ray particles and the pre-atmospheric size of the object. While the concentrations of spallation products lead to the determination of exposure and terrestrial ages, production rate ratios are characteristic for the location of the sample in the meteorite. So, one of the aims of this investigation on meteorites is to obtain depth indicators from suitable pairs of cosmogenic nuclides. Because of the different depth profiles for nuclide productions it is necessary to determine the concentrations of a larger number of spallation products in aliquots of a single small sample. Such same sample measurements of Be-10 and light noble gases were performed on 15 ordinary chondrites (7 H- and 8 L-chondrites. Be-10 was determined by accelerator mass spectrometry and the noble gases were measured by static mass spectrometry. The results are summarized and discussed.

Sarafin, R.↗
NASA NTRS1985

Compatibility of grain-stabilized platinum with candidate propellants for resistojets

An examination is conducted into the suitability of grain-stabilized Pt as a resistojet thruster material for Space Station auxiliary propulsion. A series of 1000-hour tests was conducted in CO2, H2, and NH3 at 1400 C; another series was conducted at 500 C in CH4 for the same duration. SEM, Auger electron microscopy, and depth profiling analysis were used to determine the effects of propellants on the material surface as well as to evaluate possible material contamination and possible grain growth. Carbon deposition is noted on the surface of Pt/Y2O3 and Pt/ZrO2 in both the CO2 and CH4 environments.

Whalen, M. V.↗
NASA NTRS1986

'On-line' analyses of simulated solar wind implantations of terrestrial analogs of lunar materials

In connection with the establishment of a lunar base, it would be necessary to provide water, and the feasibility to obtain water from solar wind (SW) implanted lunar soils has been considered. In this context, a project involving the examination of materials under conditions of simulated SW irradiation has been initiated. A description is presented of initial results on oligoclase, ilmenite, and simulated lunar glass (SLG). Attention is given to the reaction chamber, the target materials, the saturation concentrations, aspects of water release, depth profiles, thermal release, effects from helium-3 preimplants, mechanisms of possible water release related to direct emission and thermal release, and lunar soil components enriched in trapped SW hydrogen. It is found that ilmenite stores about twice as much deuterium as the other target materials. However, it is unknown whether the small enrichment factor will be sufficient to make the material a potential source of lunar water.

Blanford, G. E.↗
NASA NTRS1986

Sputtering and native oxide formation on (110) surfaces of Cd(1-x)Mn(x)Te

Native oxides on the surface of Cd(1-x)Mn(x)Te (X between 0 and 0.7) have been analyzed on the basis of X-ray photoemission spectroscopy measurements. Depth profile analysis revealed a significant increase in the thickness at higher Mn concentrations and a strong Mn segregation to the surface, respectively. Sputter-induced damage on cleaved (110)-oriented surfaces was analyzed by photoreflectance and photoluminescence measurements. The damage was found to be larger on CdTe than on the alloy. Thermal annealing showed nearly complete restoration for the surface of the alloy, while CdTe revealed irreversible modifications in the near-surface regime upon sputtering and post annealing.

Neff, H.↗