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NASA NTRS · 19850025951

An X-ray diffraction study of titanium oxidation

Abstract

Titanium specimens of commercial purity were exposed at 1100 to 1400 F to laboratory air for times up to 100 hours. The extent of substrate contamination by interstitial oxygen was was determined by a new X-ray diffraction analysis involving transformation of X-ray diffraction intensity bands. The oxygen solid-solubility at the oxide-metal interfaces and its variation with time at temperature were also determined. Diffusion coefficients are deduced from the oxygen depth profiles.

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BibTeXRIS

Wiedemann, K. E., Unnam, J.. 1984-01-01. An X-ray diffraction study of titanium oxidation. https://ntrs.nasa.gov/citations/19850025951

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