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At least 109 records · Page 6
All sourcesNASA NTRSDOE OSTI
NASA NTRS2022

Dusty Environment Classification and Testing: Dust Mitigation Slide Wipes & Tapes

During the Apollo missions many mechanisms, equipment, and surfaces were contaminated by lunar dust and often negatively affected. The methods used to clear these devices of dust proved ineffective, which led to premature failure in some cases. Systems being designed for upcoming missions to the Moon will need to address the performance degradation risk of dust contamination. Surfaces at risk include thermal control surfaces, solar cells, camera and sensor optics, seals, metal joints and tools, and space suit assemblies. To improve state of the art dust mitigation approaches, the dust mitigation team at NASA Glenn Research Center (GRC) explored the effects imposed on substrates during cleaning activities in the presence of lunar dust. The Uniform Dust Deposition System (UDDS) was used to conduct a study of various cleaning techniques on different substrates. Test substrates and cleaning media were selected to represent a wide range of structural and functional materials. Substrates included orthofabric, thermal radiator coating, aluminum, quartz glass, silicone rubber, aluminized Mylar, and FEP. Cleaning materials included cloth wipes, tapes, a brush, and a pliable cleaner concept. Cleaning material / substrate pairs were rated on cleaning efficiency, substrate damage, cleaning material longevity, and ease of use. The best performing cleaning method varied based on application.

lunar simulant↗
NASA NTRS1990

An Auger electron spectroscopy study of surface-preparation contaminants

There are many cleaning techniques that are presently being employed for surface preparation of materials that are subsequently exposed to ultrahigh vacuum (UHV). Unfortunately, there are virtually no comparative measurements which establish the residual contaminant level of each method. In this report, eleven different cleaning methods, ranging from only detergent cleaning to electrochemical polishing, were applied to identical samples of 347 stainless steel. Two surface conditions, a standard machined surface and a mechanically polished surface, were studied. Auger electron spectroscopy (AES) within a UHV environment was then used to detect the types of contaminants and the magnitudes found on the sample surfaces. It was found that the electrochemical polishing gave the least contaminated surface of all metals studied and that mechanically polished surfaces were significantly cleaner than the as-machined surfaces for any given cleaning method. Furthermore, it was also found that the residual contaminations left by methanol, ethanol, isopropyl alcohol, acetone, and freon finishing rinses are almost the same.

Wu, D.↗
NASA NTRS1984

Maintenance of contamination sensitive surfaces on board long-term space vehicles

In the current age, highly sensitive instruments are being flown on spacecraft, and questions of contamination have become important. The present investigation is concerned with the available approaches which can provide long-term protection for contamination sensitive surfaces. Aspects and sources of spacecraft contamination are examined, taking into account materials outgassing, particulates, propulsion system interaction, overboard venting, man-made and cosmic debris, and atomic oxygen/ambient atmosphere interaction. Suitable protection approaches provided by current technology are discussed, giving attention to aperture covers, a possibility for a retractable cover design, gaseous purges, options for prolonging the lifetime of the thermal control system, and plume shields. Some new possibilities considered are related to an early warning system for excessive amounts of contamination, a molecular/wake shield, and the use of atomic oxygen.

Phillips, A.↗
DOE OSTI2025

Modeled sensitivity of multi-MA accelerator performance to electrode contaminant inventory

Significant particle-in-cell code development has enabled simulations of power flow in multi-MA accelerators to include the desorption of surface contaminants, their ionization into surface plasmas, and the impact of these plasmas on efficiency. The simulations base desorption on an Arrhenius equation, whose most significant unknown is the surface contaminant inventory. The sensitivity of power-flow simulations to this inventory is studied here using Sandia National Laboratories' Z accelerator with a 7-nH MagLIF load [Phys. Plasmas 17, 056303 (2010)]. Simulations are conducted in 3D cylindrical coordinates for the current-adder, or “convolute,” region of Z and in 2D for the final feed only. Simulated contaminant inventories are varied from 1 to 32 monolayers (MLs) in 2D, and 2 to 4 ML in 3D. The results reveal sensitivities to the local ratio of E/B⁠. The high B-field, low E-field region near the short-circuit load is insensitive to the contaminant inventory, where assumed values of 4–32 ML change the load current by ≤ 2%, and agree with experiment to within 2% at peak current. A 1-ML value is the outlier, increasing the load current by 5%, but still within measurement uncertainty. In contrast, the relatively higher E-field, lower B-field convolute region has slower contaminant desorption and higher-magnitude E-field penetration of the surface plasmas. The current loss in the convolute region does increase with contaminant inventory. The loss assuming 4 ML is 12% larger than for 2 ML, with 4 ML being the better match to experiment.

Arrhenius equation↗
NASA NTRS1999

Consequences of Atomic Oxygen Interaction With Silicone and Silicone Contamination on Surfaces in Low Earth Orbit

The exposure of silicones to atomic oxygen in low Earth orbit causes oxidation of the surface, resulting in conversion of silicone to silica. This chemical conversion increases the elastic modulus of the surface and initiates the development of a tensile strain. Ultimately, with sufficient exposure, tensile strain leads to cracking of the surface enabling the underlying unexposed silicone to be converted to silica resulting in additional depth and extent of cracking. The use of silicone coatings for the protection of materials from atomic oxygen attack is limited because of the eventual exposure of underlying unprotected polymeric material due to deep tensile stress cracking of the oxidized silicone. The use of moderate to high volatility silicones in low Earth orbit has resulted in a silicone contamination arrival at surfaces which are simultaneously being bombarded with atomic oxygen, thus leading to conversion of the silicone contaminant to silica. As a result of these processes, a gradual accumulation of contamination occurs leading to deposits which at times have been up to several microns thick (as in the case of a Mir solar array after 10 years in space). The contamination species typically consist of silicon, oxygen and carbon. which in the synergistic environment of atomic oxygen and UV radiation leads to increased solar absorptance and reduced solar transmittance. A comparison of the results of atomic oxygen interaction with silicones and silicone contamination will be presented based on the LDEF, EOIM-111, Offeq-3 spacecraft and Mir solar array in-space results. The design of a contamination pin-hole camera space experiment which uses atomic oxygen to produce an image of the sources of silicone contamination will also be presented.

Banks, Bruce A.↗
NASA NTRS1988

Contamination Barrier For Contour-Molding Material

Release agent prevents molding compound from adhering to or contaminating surface. Cleaning agent, Turco 4215 NCLT, forms barrier preventing silicone molding compound from sticking to surface and leaving contaminating residue. Also see MFS-29243.

Adams, James F.↗
NASA NTRS1989

Scatter from optical components; Proceedings of the Meeting, San Diego, CA, Aug. 8-10, 1989

Various papers on scatter from optical components are presented. Individual topics addressed include: BRDF of SiC and Al foam compared to black paint at 3.39 microns, characterization of optical baffle materials, bidirectional transmittance distribution function of several IR materials at 3.39 microns, thermal cycling effects on the BRDF of beryllium mirrors, BTDV of ZnSe with multilayer coatings at 3.39 microns, scattering from contaminated surfaces, cleanliness correlation by BRDF and PFO instruments, contamination effects on optical surfaces, means of eliminating the effects of particulate contamination on scatter measurements of superfine optical surfaces, vacuum BRDF measurement of cryogenic optical surfaces, Monte Carlo simulation of contaminant transport to and deposition on complex spacecraft surfaces, surface particle observation and BRDF predictions, satellite material contaminant optical properties, dark field photographic techniques for documenting optical surface contamination, design of a laboratory study of contaminant film darkening in space, contamination monitoring approaches for EUV space optics.

Stover, John C.↗
DOE OSTI2025

Improving the Performance of Mid-T Baked Niobium Cavities through Post-Bake Surface Treatment

he Medium temperature (mid-T) baking of niobium superconducting radio-frequency cavities at 300 350 C in a vacuum furnace is known to enhance the quality factor (Q₀). However, despite this improvement, cavities treated with this process often exhibit premature quench at relatively low accelerating fields. This limitation is suspected to arise from the formation of surface contaminants, such as niobium carbides, during the furnace bake at 350 C for 3 h. To investigate the influence of potential surface contamination, this study applied an ultralight chemical removal to 1.3 GHz and 650 MHz single-cell cavities that had undergone medium-temperature baking. The removal of the top RF surface layer led to a notable improvement in the quench field and Q₀, indicating a beneficial effect of eliminating possible surface residues introduced during the bake.

Chouhan, Vijay [Fermilab]↗
DOE OSTI2026

Improving the performance of mid-T baked niobium cavities through post-bake surface treatment

The Medium temperature (mid-T) baking of niobium superconducting radio-frequency cavities at 300 350 C in a vacuum furnace is known to enhance the quality factor (Q₀). However, despite this improvement, cavities treated with this process often exhibit premature quench at relatively low accelerating fields. This limitation is suspected to arise from the formation of surface contaminants, such as niobium carbides, during the furnace bake at 350 C for 3 h. To investigate the influence of potential surface contamination, this study applied an ultralight chemical removal to 1.3 GHz and 650 MHz single-cell cavities that had undergone medium-temperature baking. The removal of the top RF surface layer led to a notable improvement in the quench field and Q₀, indicating a beneficial effect of eliminating possible surface residues introduced during the bake.

Chouhan, V. [Fermilab] (ORCID:0000000282004931)↗
NASA NTRS1998

Comparison of Contamination Model Predictions to LDEF Surface Measurements

Contaminant deposition measurements have been made on species content and depth profiles on three experiments trays from the Long Duration Exposure Facility (LDEF), Auger, Argon sputtering, Electron Spectroscopy for Chemical Analysis (ESCA) and Scanning Electron Microscopy (SEM) analysis. The integrated spacecraft environment model (ISEM) was used to predict the deposition levels of the contaminants measured on the three trays. The details of the modeling and assumptions used are presented along with the predictions for the deposition on select surfaces on the trays. These are compared to the measured results. The trays represent surfaces that have a high atomic oxygen flux, and intermediate oxygen flux, and no oxygen flux. All surfaces received significant solar Ultraviolet flux. It appears that the atomic oxygen was the primary agent that caused significant deposition to occur. Surfaces that saw significant contaminant flux solar UV and no atomic oxygen did not show any appreciable levels of observable deposition. The implications of the atom ic oxygen interaction with contaminant deposits containing silicon contaminant sources is discussed. The primary contaminant sources are DC61104 adhesive and Z306 paint. The results and interpretation of the findings have a potential significant impact on spacecraft surfaces that are exposed to solar UV and atomic oxygen in low Earth orbit.

Gordon, Tim↗
NASA NTRS1992

Elemental Analyses of Hypervelocity Microparticle Impact Sites on Interplanetary Dust Experiment Sensor Surfaces

The Interplanetary Dust Experiment (IDE) had over 450 electrically active ultra-high purity metal-oxide-silicon impact detectors located on the six primary sides of the Long Duration Exposure Facility (LDEF). Hypervelocity microparticles (approximately 0.2 to approximately 100 micron diameter) that struck the active sensors with enough energy to breakdown the 0.4 or 1.0 micron thick SiO2 insulator layer separating the silicon base (the negative electrode), and the 1000 A thick surface layer of aluminum (the positive electrode) caused electrical discharges that were recorded for the first year of orbit. The high purity Al-SiO2-Si substrates allowed detection of trace (ppm) amounts of hypervelocity impactor residues. After sputtering through a layer of surface contamination, secondary ion mass spectrometry (SIMS) was used to create two-dimensional elemental ion intensity maps of microparticle sites on the IDE sensors. The element intensities in the central craters of the impacts were corrected for relative ion yields and instrumental conditions and then normalized to silicon. The results classification resulted from the particles' origins as 'manmade', 'natural', or 'indeterminate'. The last classification resulted from the presence of too little impactor residue, analytical interference from high background contamination, the lack of information on silicon and aluminum residues, or a combination of these circumstances. Several analytical 'blank' discharges were induced on flight sensors by pressing down on the sensor surface with a pure silicon shard. Analyses of these blank discharges showed that the discharge energy blasts away the layer of surface contamination. Only Si and Al were detected inside the discharge zones, including the central craters, of these features. Thus far, a total of 79 randomly selected microparticle impact sites from the six primary sides of the LDEF were analyzed: 36 from tray C-9 (Leading (ram), or east, side), 18 from tray C-3 (Trailing (wake), or west, side), 12 from tray B-12 (north side), 4 from tray D-6 (south side), 3 from tray H-11 (space end), and 6 from tray G-10 (earth end). Residue from manmade debris was identified in craters on all trays (aluminum oxide particle residues were not detectable on the Al/Si substrates). These results were consistent with the IDE impact record which showed highly variable long term microparticle impact flux rates on the west, space, and Earth sides of the LDEF which could not be ascribed to astronomical variability of micrometeorite density. The IDE record also showed episodic bursts of microparticle impacts on the east, north, and south sides of the satellite, denoting passage through orbital debris clouds or rings.

Simon, C. G.↗
NASA NTRS1993

Elemental analyses of hypervelocity microparticle impact sites on Interplanetary Dust Experiment sensor surfaces

The Interplanetary Dust Experiment (IDE) had over 450 electrically active ultra-high purity metal-oxide-silicon impact detectors located on the six primary sides of the Long Duration Exposure Facility (LDEF). Hypervelocity microparticles (approximately 0.2 to approximately 100 micron diameter) that struck the active sensors with enough energy to break down the 0.4 or 1.0 micron thick SIO2 insulator layer separating the silicon base (the negative electrode), and the 1000 A thick surface layer of aluminum (the positive electrode) caused electrical discharges that were recorded for the first year of orbit. The high purity Al-SiO2-Si substrates allowed detection of trace (ppm) amounts of hypervelocity impactor residues. After sputtering through a layer of surface contamination, secondary ion mass spectrometry (SIMS) was used to create two-dimensional elemental ion intensity maps of microparticle impact sites on the IDE sensors. The element intensities in the central craters of the impacts were corrected for relative ion yields and instrumental conditions and then normalized to silicon. The results were used to classify the particles' origins as 'manmade,' 'natural,' or 'indeterminate.' The last classification resulted from the presence of too little impactor residue, analytical interference from high background contamination, the lack of information on silicon and aluminum residues, or a combination of these circumstances. Several analytical 'blank' discharges were induced on flight sensors by pressing down on the sensor surface with a pure silicon shard. Analyses of these blank discharges showed that the discharge energy blasts away the layer of surface contamination. Only Si and Al were detected inside the discharge zones, including the central craters of these features. Thus far a total of 79 randomly selected microparticle impact sites from the six primary sides of the LDEF have been analyzed: 36 from tray C-9 (Leading (ram), or East, side), 18 from tray C-3 (Trailing (wake), or West, side), 12 from tray B-12 (North side), 4 from tray D-6 (South side), 3 from tray H-11 (Space end), and 6 from tray G-10 (Earth end). Residue from manmade debris was identified in craters on all trays. (Aluminum oxide particle residues were not detectable on the Al/Si substrates.) These results were consistent with the IDE impact record which showed highly variable long term microparticle impact flux rates on the West, Space and Earth sides of the LDEF which could not be ascribed to astronomical variability of micrometeorite density. The IDE record also showed episodic bursts of microparticle impacts on the East, North, and South sides of the satellite, denoting passage through orbital debris clouds or rings.

Simon, Charles G.↗
DOE OSTI2024

Effect of H + Exchange and Surface Impurities on Bulk and Interfacial Electrochemistry of Garnet Solid Electrolytes

Contact loss and current constriction pose significant challenges at the Li metal interface of solid-state batteries. For garnet-structured Li 7 La 3 Zr 2 O 12 (LLZO), these effects are amplified by Li + /H + exchange and surface contamination reactions, which lead to conductivity losses and poor Li wetting. In this study, we utilize a variety of surface treatment processes across 37 cells to selectively induce proton exchange and contamination reactions in LLZO. The resulting bulk and surface chemistry is systematically characterized and correlated to changes in electrochemical properties. Additionally, we combine impedance analysis and finite element method modeling to deconvolute sources of impedance contributions at the Li metal interface. Specifically, we show that constriction impedance at the Li metal interface arises not solely from voids, but also from ionically-resistive surface contaminants. Further, these findings emphasize the connection between ionic conductivity and constriction, demonstrating that micron-scale ionically-resistive components increase constriction even with identical contact geometries. Finally, we leverage our comprehensive dataset to highlight unstable overpotential growth as a failure mechanism, additionally showing that the phase of a cell’s impedance is a sensitive indicator for the onset of interfacial instability. Overall, this study clarifies the impacts of proton exchange and surface contamination on electrochemical properties at the Li|solid electrolyte interface and elucidates insights that are generalizable to other solid-state battery systems.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗
NASA NTRS1992

Elemental analyses of hypervelocity micro-particle impact sites on interplanetary dust experiment sensor surfaces

The Interplanetary Dust Experiment (IDE) had over 450 electrically active ultra-high purity metal-oxide-silicon impact detectors located on the six primary sides of the Long Duration Exposure Facility (LDEF). Hypervelocity micro-particles that struck the active sensors with enough energy to breakdown the 0.4 to 1.0 micron thick SiO2 insulator layer separating the silicon base (the negative electrode), and the 1000 A thick surface layer of aluminum (the positive electrode) caused electrical discharges that were recorded for the first year of orbit. These discharge features, which include 50 micron diameter areas where the aluminum top layer has been vaporized, facilitate the location of the impacts. The high purity Al-SiO2-Si substrates allow detection of trace (ppm) amounts of hypervelocity impactor residues. After sputtering through a layer of surface contamination, secondary ion mass spectrometry (SIMS) is used to create two-dimensional elemental ion intensity maps of micro-particle impact sites on the IDE sensors. The element intensities in the central craters of the impacts are corrected for relative ion yields and instrumental conditions and then normalized to silicon. The results are used to classify the particles' origins as 'manmade', 'natural' or 'indeterminate'. The last classification results from the presence of too little impactor residue (a frequent occurrence on leading edge impacts), analytical interference from high background contamination, the lack of information on silicon residue, the limited usefulness of data on aluminum in the central craters, or a combination of these circumstances. Several analytical 'blank' discharges were induced on flight sensors by pressing down on the sensor surface with a pure silicon shard. Analyses of these blank discharges showed that the discharge energy blasts away the layer of surface contamination. Only Si and Al were detected inside the discharge zones, including the central craters, of these features. A total of 35 impacts on leading edge sensors and 22 impacts on trailing edge sensors were analyzed.

Simon, Charles G.↗
NASA NTRS2017

Surface Monitoring of CFRP Structures for Adhesive Bonding

Adhesive bonding of composite materials requires reliable monitoring and detection of surface contaminants to assure robust and durable bonded structures. Surface treatment and effective monitoring prior to bonding is essential in order to obtain a surface free from contaminants that may degrade structural performance. Two techniques which monitor the effectiveness of the laser surface treatment of carbon fiber reinforced polymer (CFRP) materials are being investigated: laser induced breakdown spectroscopy (LIBS) and optically stimulated electron emission (OSEE). The applicability of LIBS to detect silicone contaminants on CFRP composites is studied using ~35 ns Nd:YAG laser pulses at 355 nm with a pulse energy of 45 mJ. The LIBS regime in which pulse energies are < 100 mJ is referred to as mLIBS. CFRP surfaces were contaminated with polydimethylsiloxane (PDMS), a major component of silicone based mold release agents. The presence of PDMS is found by inspecting the Si I emission line at 288.2 nm. Untreated CFRP samples and CFRP contaminated with PDMS were tested. The PDMS areal density ranged from 0.36 Â+/- 0.04 to 0.51 Â+/- 0.16 mg/cm2. The results demonstrate the successful detection of PDMS on CFRP using mLIBS. In addition, OSEE was used to measure CFRP surface cleanliness pre- and post-treatment by laser ablation on specimens contaminated with PDMS coatings from 8 nm to 1311 nm in thickness. The results showed a significant increase in the OSEE photocurrent after laser surface treatment.

Ledesma, Rodolfo↗
NASA NTRS1978

Plasma cleaning device

High vacuum cleaning of contaminated surfaces such as hydrocarbon containment films can be accomplished by a plasma cleaning device which includes a plasma discharge housing to permit generation of a plasma in an environment having a higher pressure than the surface which is to be cleaned. A ground electrode and a radio frequency electrode partially surround a quartz plasma tube, for the introduction of an ionizable gas. These electrodes ionize the gas and help generate the plasma. This plasma flows through a non-constrictive aperture, through the plasma discharge housing and then on to the contaminated surface.

Shannon, R. L.↗